著 作 與 技 術 報 告
著 作 與 技 術 報 告

[Journal Papers][技術報告]

Journal Papers

1.   C. J. Lu and D. M. Tsai, “Defect Inspection of Patterned TFT-LCD Panels Using a Fast Sub-Image Based SVD,” International Journal of Production Research (in press). (SCI)

2.   H. N. Yen and D. M. Tsai, "A fast full-field 3D measurement system for BGA coplanarity inspection," International Journal of Advanced Manufacturing Technology (in press and to appear in 2004). (SCI)

3.   C. J. Lu and D. M. Tsai, “Automatic Defect Inspection for LCDs Using Singular Value Decomposition,” International Journal of Advanced Manufacturing Technology (in press). (SCI) 

4.   D. M. Tsai, C. T. Lin and J. F. Chen, 2003, “The Evaluation of Normalized Cross Correlations for Defect Detection,” Pattern Recognition Letters, Vol.24, pp.2525-2535. (SCI)

5.   D. M. Tsai and C. T. Lin, 2003, ”Fast Normalized Cross Correlation for Defect Detection,” Pattern Recognition Letters, Vol. 24, pp. 2625-2631. (SCI)

6.      D. M. Tsai and T. Y. Huang, 2003, “Automated Surface Inspection for Statistical Textures,” Image and Vision Computing, Vol. 21, pp.307-323.

7.      D. M. Tsai and C .H. Chiang, 2003, “Automatic Band Selection for Wavelet Reconstruction in The Application of Defect Detection,” Image and Vision Computing Vol. 21, pp.413-431.

8.      D. M. Tsai and C. C. Chou, 2003, “A Fast Focus Measure for Video Display Inspection,” Machine Vision & Applications, Vol. 14, pp.192-196.

9.      K. H. Hsiehn and D. M. Tsai, 2003, “A non-Referential Machine Vision Approach for BGA Substrate Inspection,” Journal of the Chinese Institute of Industrial Engineers Vol. 20, pp.125-138.

10.  D. M. Tsai and C. P. Lin, 2003,  “Fast Defect Defect Detection in Textured Surfaces Using 1D Gabor Filters,” International Journal of Advanced Manufacturing Technology Vol. 20, pp.664-675.

11.  D. M. Tsai and Y. H. Tsai, 2003,  “Defect Detection in Textured Surfaces Using Color Ring-Projection Correlation,” Machine Vision and Applications Vol. 13, pp.194-200.

12.  D. M. Tsai and B. T. Lin, 2002, “Defect Detection of Gold-Plated Surfaces on PCBs Using Entropy Measures,” International Journal of Advanced Manufacturing Technology Vol. 20, pp.420-428.

13.  D. M. Tsai and C. H. Chiang, 2002, “Rotation-Invariant Pattern Matching Using Wavelet Decomposition,” Pattern Recognition Letters, Vol. 23, pp. 191-201.

14.  D. M. Tsai and Y. H. Tsai, 2002, “Rotation-Invariant Pattern Matching with Color Ring-Projection,” Pattern Recognition, Vol. 35, pp. 131-141.

15.  C. H. Yeh and D. M. Tsai, 2001, “Wavelet-Based Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection,” International Journal of Production Research, Vol. 39, pp.4281-4299.

16.  D. M. Tsai and B. Hsiao, 2001, “Automatic Surface Inspection Using Wavelet Reconstruction,” Pattern Recognition, Vol. 34, pp. 1285-1305. (SCI)

17.  D. M. Tsai, S. K. Wu and M. C. Chen, 2001, “Optimal Gabor Filter Design for Texture Segmentation Using Stochastic Optimization,” Image and Vision Computing, Vol. 19, pp. 299-316. (SCI)   

18.  C. H. Yeh and D. M. Tsai, 2001,“A Rotation-Invariant and Nonreferential Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection,” International Journal of Advanced Manufacturing Technology, Vol. 17, pp.412-424. (SCI) 

19.  D. M. Tsai and S. K. Wu, 2000, “Automated Surface Inspection Using Gabor Filters,” International Journal of Advanced Manufacturing Technology , Vol. 16, pp. 474-482. (SCI)

20.  D. M. Tsai and C. Y. Hsieh, 1999, “Automated Surface Inspection for Directional Textures,” Image and Vision Computing, Vol. 18, pp. 49-62. (SCI) 

21.  S. M. Guu and D. M. Tsai, 1999, “Measurement of Roundness: a Nonlinear Approach,” Proc. Natl. Sci. Counc. ROC(A), Vol. 23, pp. 348-352.

22.  P. K. Wang and D. M. Tsai, 1999, “Machine Vision for Leadframe Process Quality Monitoring,” Journal of the Chinese Institute of Industrial Engineers, Vol.16, pp. 533-549; NSC88-2212-E-155-010. (in Chinese)

23.  D. M. Tsai and C. F. Tseng, 1999, “Surface Roughness Classification for Castings,” Pattern Recognition, Vol. 32, pp. 389-405; NSC88-2213-E-155-013. (SCI) 

24.  D. M. Tsai, 1999, “A Machine Vision Approach for Detecting and Inspecting Circular Parts,” International Journal of Advanced Manufacturing Technology, Vol. 15, pp. 217-221. (SCI) 

25.  D. M. Tsai, H.-T. Hou and H.-J. Su, 1999, “Boundary-based Corner Detection Using Eigenvalues of Covariance Matrices,” Pattern Recognition Letters, Vol. 20, pp. 31-40. (SCI) 

26.  M. C. Chen, D. M. Tsai and H. Y. Tseng, 1999, “A Stochastic Optimization Approach for Roundness Measurements,” Pattern Recognition Letters, Vol. 20, pp. 707-719. (SCI)

27.  D. M. Tsai and H. J. Wang, 1998, “Segmenting Focused Objects in Complex Visual Images,” Pattern Recognition Letters, Vol. 19, pp. 929-940. (SCI) 

28.  D. M. Tsai, J. J. Chen and J. F. Chen, 1998, “A Vision System for Surface Roughness Assessment Using Neural Networks,” International Journal of Advanced Manufacturing Technology, Vol. 14, pp. 412-422; NSC87-2213-E-155-021. (SCI) 

29.  D. M. Tsai, C. Y. Chien and P. K. Wang, 1998, “Model Based 3D Parts Recognition from a Single Image,” Journal of the Chinese Institute of Industrial Engineers, Vol.15, pp.523-532; NSC85-2212-E-155-010.(in Chinese)

30.  D. M. Tsai and C. T. Lin, 1998, “A Moment-Preserving Approach for Depth from Defocus,” Pattern Recognition, Vol. 31, pp. 551-560; NSC87-2212-E-155-006. (SCI)

31.  D. M. Tsai, 1997, “An Improved Generalized Hough Transform for the Recognition of Overlapping Objects,” Image and Vision Computing, Vol. 15, pp. 887-888; NSC84-2213-E-155-002. (SCI)

32.  D. M. Tsai, and J. I. Tzeng, 1997, “Dimensional and Angular Measurements Using Least Squares and Neural Networks,” International Journal of Advanced Manufacturing Technology, Vol. 13, pp. 55-66; NSC86-2213-E-155-003. (SCI) 

33.  D. M. Tsai, 1997, “Boundary-based Corner Detection Using Neural Networks,” Pattern Recognition, Vol. 31, pp. 85-97. (SCI)

34.  D. M. Tsai, 1996, “Locating Overlapping Industrial Parts for Robotic Assembly,” International Journal of Advanced Manufacturing Technology, Vol. 12, pp. 288-302; NSC83-0415-E-155-033. (SCI)

35.  M. C. Chen and D. M. Tsai, 1996, “Simulation Optimization through Direct Search for Multi-Objective Manufacturing Systems,” Production Planning and Control, Vol. 17, pp. 554-565. (SCI) 

36.  D. M. Tsai and R. Y. Tsai, 1996, “Use Neural Networks to Determine Matching Order for Recognizing Overlapping Objects,” Pattern Recognition Letters, Vol. 17, pp. 1077-1088. (SCI)

37.  M. C. Chen and D. M. Tsai, 1996, “A Simulated Annealing Approach for Optimization of Multi-pass Turning Operations,” International Journal of Production Research, Vol. 34, pp. 2803-2825. (SCI)

38.  D. M. Tsai and M. F. Chen, 1996, “A Fast Machine Vision Approach for Automatic Recognition of Industrial Parts,” International Journal of Production Research, Vol. 34, pp. 687-699. (SCI)

39.  D. M. Tsai, 1996, “Detecting and Locating Partially Occluded Planar Parts by Clustering,” IIE Transactions, Vol. 28, pp. 531-544; NSC82-0415-E-155-020. (SCI)

40.  D. M. Tsai and W. J. Lu, 1996, “Detecting and Locating Burrs of Industrial Parts,” International Journal of Production Research, Vol. 34, pp. 3187-3205; NSC82-0415-E-155-068. (SCI)

41.  M. F. Chen and D. M. Tsai, 1996, “Economic design of turning operations," Journal of the Chinese Institute of Industrial Engineers, Vol.13, pp.349-361.(in Chinese)

42.  D. M. Tsai, 1995, “A Three-Dimensional Machine Vision Approach for Automatic Robot Programming,” Journal of Intelligent and Robotic Systems, Vol. 12, pp. 23-48; NSC80-0415-E-155-02 and NSC81-0415-E-155-07. (SCI)

43.  D. M. Tsai and M. F. Chen, 1995, “Object Recognition by a Linear Weight Classifier,” Pattern Recognition Letters, Vol. 16, pp. 591-600. (SCI)

44.  D. M. Tsai, 1995, “A Fast Thresholding Selection Procedure for Multimodal and Unimodal Histograms,” Pattern Recognition Letters, Vol. 16, pp. 653-666. (SCI)

45.  D. M. Tsai and M. F. Chen, 1994“Curve Fitting Approach for Tangent Angle and 
Curvature Measurements,” Pattern Recognition, Vol. 27, pp. 699-711.

46.  D. M. Tsai, E. M. Malstrom and W. Kuo, “Physical Simulation of a Three 
Dimensional Palletizing Heuristic,” International Journal of Production Research, 
Vol. 32, pp. 1159-1171, 1994.

47.  D. M. Tsai and M. J. Yao,  1993“A Line-Balance-Based Capacity Planning Procedure for Series-Type Robotic Assembly Line,” International Journal of Production Research, Vol. 31, pp. 1901-1920.

48.  D. M. Tsai, E. M. Malstrom and W. Kuo, “Three Dimensional Pallelization of 
Mixed Box Sizes,” IIE Transactions, Vol. Pp. 64-75, 1993. 

49.  D. M. Tsai and Y. H. Chen, “A Fast Histogram-Clustering Approach for Multi-level 
Thresholding,” Pattern Recognition Letters, Vol. 13, pp. 245-255, 1992.

50.  D. M. Tsai and E. M. Malstrom and H. D. Meeks, 1988, “A Two-Dimensional palletizing Procedure for Warehouse Loading Operations,” IIE Transactions, Vol. 20, pp. 418-425.

51.  R. H. Choi, E. M. Malstrom and D. M. Tsai, 1988,“Evaluating Lot-Sizing Methods in Multilevel Inventory System by Simulation,” Production and Inventory Management Journal, Vol. 29, pp. 4-10.

 


技術報告

  Automated surface inspection
  PCB defect inspection
  LCD defect inspection
  Correlation-based defect detection
  Gabor-filter design for texture segmentation & inspection
  3D measurement system for electronic industries
  Shape recognition & measurement
  Depth from defocus & focus measure
  Corner detection
  Rotation-invariant pattern matching

[TOP]