學歷  經歷  研究領域 

個人榮譽  期刊論文  研討會論文

• 講座教授，元智大學，2007

• 特約研究員，國家科學委員會，2006~2009

• 第二屆有庠傑出講座，徐有庠先生紀念基金會，2006 

• 研究傑出獎，元智大學，2005

• 第一屆有庠傑出講座，徐有庠先生紀念基金會，2005

• 傑出研究獎，國科會， 2003

• 有庠傑出教授獎，徐有庠先生紀念基金會科技獎，2002

• 傑出研究獎，國科會， 2001

• 傑出教授獎，元智大學， 2001

• 傑出研究教授優等獎，元智大學，2001

• 傑出研究獎，國科會，1999.

1.       D. M. Tsai and S. C. Lai, 2008,“Independent component analysis-based background subtraction for indoor surveillance,”IEEE Transactions on Image Processing. (to appear)

2.       D. M. Tsai and W. Y. Chiu, 2008, “Motion detection using Fourier image reconstruction,” Pattern Recognition Letters. (to appear)

3.       H. N. Yen, D. M. Tsai and S. K Feng, 2008, “Full-field 3D flip-chip solder bumps measurement using DLP-based phase shifting technique,”IEEE Transactions on Advanced Packaging. (to appear)

4.       S. M. Chao and D. M. Tsai, 2008, “An anisotropic diffusion-based defect detection for low-contrast glass substrates,” Image and Vision Computing, Vol. 26, pp.187-200. (SCI, EI)

5.       C. J. Lu and D. M. Tsai, 2008, “Independent component analysis-based defect detection in patterned liquid crystal display surfaces,”Image and Vision Computing, Vol. 26, pp.955-970. (SCI)

6.       D. M. Tsai and S. T. Chuang, 2008, “1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations,” Machine Vision and Applications. (to appear)

7.      D. M. Tsai and S. C. Lai, 2008, “Defect detection in periodically patterned surfaces using independent component analysis,” Pattern Recognition, Vol. 41, pp.2812-2832.

8.      D. M. Tsai and Y. J. Su, 2007, “ Non-referential, self-compared shape defect inspection for bond pads with deformed shapes,” International Journal of Production Research. (to appear)

9.      D. M. Tsai and C. C. Kuo, 2007, “ Defect detection in inhomogeneously-textured sputtered surfaces using 3D Fourier image reconstruction,” Machine Vision and Applications, Vol. 18, No. 6, pp. 383-400.

10.      D. M. Tsai, S. T. Chuang and Y. H. Tseng, 2007,“One-dimensional Based Automatic Defect Inspection of Multiple Patterned TFT-LCD Panels using Fourier Image Reconstruction,” International Journal of Production Research, Vol. 45, pp. 1297-1321. (SCI)

11.      D. M. Tsai, P. C. Lin and C. J. Lu, 2006,“An independent component analysis-based filter design for defect detection in low-contrast surface images ,”Pattern Recognition, Vol. 39, pp. 1679-1694. (SCI)   [code]

12.      S. M. Chao and D. M. Tsai, 2006,“Astronomical image restoration using an improved anisotropic diffusion,” Pattern Recognition Letters, Vol. 27, pp. 335-344. (SCI) 

13.      H.  N. Yen, D. M. Tsai and J. Y. Yang, 2006,“Full-field 3D measurement of solder pastes using LCD-based phase shifting techniques,”IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29, No. 1, pp. 50-57. (SCI)

14.      Y. H. Tseng and D. M. Tsai ,2006, “Using Independent Component Analysis Based Process Monitoring in TFT-LCD Manufacturing,” Journal of the Chinese Institute of Industrial Engineers, Vol. 23, No. 3, pp. 262-267. (EI)

15.      D. M. Tsai and R. H. Yang, 2005, “An eigenvalue-based similarity measure and its application in defect detection, ” Image and Vision Computing,  Vol. 23, pp. 1094-1101. (SCI)

16.      D. M. Tsai and C. H. Yang, 2005,“A quantile-quantile plot based pattern matching for defect detection,” Pattern Recognition Letters , Vol. 26, pp. 1948-1962. (SCI)

17.      D. M. Tsai and C. Y. Hung, 2005, “Automatic Defect Inspection of Patterned TFT-LCD Panels Using 1-D Fourier Reconstruction and Wavelet Decomposition,” International Journal of Production Research, Vol. 43, No. 21, 4589-4607. (SCI)

18.       D. M. Tsai, C. P. Lin and K. T. Huang, 2005, “Defect detection in colored texture surfaces using Gabor filters,” The Imaging Science Journal, Vol. 53, pp. 27-37. (SCI)

19.       D. M. Tsai and S. M. Chao, 2005, “An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,” Image and Vision Computing, Vol. 23, pp. 325-338. (SCI)

20.       C. J. Lu and D. M. Tsai, 2005, “Automatic Defect Inspection for LCDs Using Singular Value Decomposition,” International Journal of Advanced Manufacturing Technology, Vol. 25, pp. 53-61. (SCI)

21.       E. Zahara, S. K. S. Fan. and D. M. Tsai, 2005, “Optimal multi-thresholding using a hybrid optimization approach,” Pattern Recognition Letters, Vol.26, pp. 1082-1095. (SCI)

22.       C. J. Lu and D. M. Tsai, 2004, “Defect Inspection of Patterned TFT-LCD Panels Using a Fast Sub-Image Based SVD,” International Journal of Production Research, Vol. 42, pp.4331-4351. (SCI)

23.       H. N. Yen and D. M. Tsai, 2004, “A fast full-field 3D measurement system for BGA coplanarity inspection," International Journal of Advanced Manufacturing Technology, Vol. 24, pp.132-139. (SCI)

24.       D. M. Tsai, C. T. Lin and J. F. Chen, 2003, “The Evaluation of Normalized Cross Correlations for Defect Detection,” Pattern Recognition Letters, Vol.24, pp.2525-2535. (SCI)

25.       D. M. Tsai and C. T. Lin, 2003, “Fast Normalized Cross Correlation for Defect Detection,” Pattern Recognition Letters, Vol. 24, pp. 2625-2631. (SCI)

26.       D. M. Tsai and T. Y. Huang, 2003, “Automated Surface Inspection for Statistical Textures,” Image and Vision Computing, Vol. 21, pp.307-323.

27.          D. M. Tsai and C .H. Chiang, 2003, “Automatic Band Selection for Wavelet Reconstruction in The Application of Defect Detection,” Image and Vision Computing Vol. 21, pp.413-431.

28.          D. M. Tsai and C. C. Chou, 2003, “A Fast Focus Measure for Video Display Inspection,” Machine Vision & Applications, Vol. 14, pp.192-196.

29.        K. H. Hsiehn and D. M. Tsai, 2003, “A non-Referential Machine Vision Approach for BGA Substrate Inspection,” Journal of the Chinese Institute of Industrial Engineers Vol. 20, pp.125-138.

30.         D. M. Tsai and C. P. Lin, 2003, “Fast Defect Detection in Textured Surfaces Using 1D Gabor Filters,” International Journal of Advanced Manufacturing Technology Vol. 20, pp.664-675.

31.        D. M. Tsai and Y. H. Tsai, 2003, “Defect Detection in Textured Surfaces Using Color Ring-Projection Correlation,” Machine Vision and Applications Vol. 13, pp.194-200.

32.         D. M. Tsai and B. T. Lin, 2002, “Defect Detection of Gold-Plated Surfaces on PCBs Using Entropy Measures,” International Journal of Advanced Manufacturing Technology Vol. 20, pp.420-428.

33.       D. M. Tsai and C. P. Lin, 2002, “Fast defect detection in textured surfaces unsing 1D Gabor filters,” International Journal of Advanced Manufacturing Technology, Vol. 20, pp.664-675.

34.        D. M. Tsai and C. H. Chiang, 2002, “Rotation-Invariant Pattern Matching Using Wavelet Decomposition,” Pattern Recognition Letters, Vol. 23, pp. 191-201.

35.        D. M. Tsai and Y. H. Tsai, 2002, “Rotation-Invariant Pattern Matching with Color Ring-Projection,” Pattern Recognition, Vol. 35, pp. 131-141.

36.        C. H. Yeh and D. M. Tsai, 2001, “Wavelet-Based Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection,” International Journal of Production Research, Vol. 39, pp.4281-4299.

37.        D. M. Tsai and B. Hsiao, 2001, “Automatic Surface Inspection Using Wavelet Reconstruction,” Pattern Recognition, Vol. 34, pp. 1285-1305. (SCI)

38.        D. M. Tsai, S. K. Wu and M. C. Chen, 2001, “Optimal Gabor Filter Design for Texture Segmentation Using Stochastic Optimization,” Image and Vision Computing, Vol. 19, pp. 299-316. (SCI)   

39.       C. H. Yeh and D. M. Tsai, 2001,“A Rotation-Invariant and Nonreferential Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection,” International Journal of Advanced Manufacturing Technology, Vol. 17, pp.412-424. (SCI) 

40.        D. M. Tsai and S. K. Wu, 2000, “Automated Surface Inspection Using Gabor Filters,” International Journal of Advanced Manufacturing Technology , Vol. 16, pp. 474-482. (SCI)

41.       D. M. Tsai and C. Y. Hsieh, 1999, “Automated Surface Inspection for Directional Textures,” Image and Vision Computing, Vol. 18, pp. 49-62. (SCI) 

42.        S. M. Guu and D. M. Tsai, 1999, “Measurement of Roundness: a Nonlinear Approach,” Proc. Natl. Sci. Counc. ROC(A), Vol. 23, pp. 348-352.

43.        P. K. Wang and D. M. Tsai, 1999, “Machine Vision for Leadframe Process Quality Monitoring,” Journal of the Chinese Institute of Industrial Engineers, Vol.16, pp. 533-549; NSC88-2212-E-155-010. (in Chinese)

44.       D. M. Tsai and C. F. Tseng, 1999, “Surface Roughness Classification for Castings,” Pattern Recognition, Vol. 32, pp. 389-405; NSC88-2213-E-155-013. (SCI) 

45.        D. M. Tsai, 1999, “A Machine Vision Approach for Detecting and Inspecting Circular Parts,” International Journal of Advanced Manufacturing Technology, Vol. 15, pp. 217-221. (SCI) 

46.         D. M. Tsai, H.-T. Hou and H.-J. Su, 1999, “Boundary-based Corner Detection Using Eigenvalues of Covariance Matrices,” Pattern Recognition Letters, Vol. 20, pp. 31-40. (SCI) 

47.        M. C. Chen, D. M. Tsai and H. Y. Tseng, 1999, “A Stochastic Optimization Approach for Roundness Measurements,” Pattern Recognition Letters, Vol. 20, pp. 707-719. (SCI)

48.         D. M. Tsai and H. J. Wang, 1998, “Segmenting Focused Objects in Complex Visual Images,” Pattern Recognition Letters, Vol. 19, pp. 929-940. (SCI) 

49.       D. M. Tsai, J. J. Chen and J. F. Chen, 1998, “A Vision System for Surface Roughness Assessment Using Neural Networks,” International Journal of Advanced Manufacturing Technology, Vol. 14, pp. 412-422; NSC87-2213-E-155-021. (SCI) 

50.       D. M. Tsai, C. Y. Chien and P. K. Wang, 1998, “Model Based 3D Parts Recognition from a Single Image,” Journal of the Chinese Institute of Industrial Engineers, Vol.15, pp.523-532; NSC85-2212-E-155-010.(in Chinese)

51.       D. M. Tsai and C. T. Lin, 1998, “A Moment-Preserving Approach for Depth from Defocus,” Pattern Recognition, Vol. 31, pp. 551-560; NSC87-2212-E-155-006. (SCI)

52.       D. M. Tsai, 1997, “An Improved Generalized Hough Transform for the Recognition of Overlapping Objects,” Image and Vision Computing, Vol. 15, pp. 887-888; NSC84-2213-E-155-002. (SCI)

53.        D. M. Tsai, and J. I. Tzeng, 1997, “Dimensional and Angular Measurements Using Least Squares and Neural Networks,” International Journal of Advanced Manufacturing Technology, Vol. 13, pp. 55-66; NSC86-2213-E-155-003. (SCI) 

54.        D. M. Tsai, 1997, “Boundary-based Corner Detection Using Neural Networks,” Pattern Recognition, Vol. 31, pp. 85-97. (SCI)

55.      D. M. Tsai, 1996, “Locating Overlapping Industrial Parts for Robotic Assembly,” International Journal of Advanced Manufacturing Technology, Vol. 12, pp. 288-302; NSC83-0415-E-155-033. (SCI)

56.       M. C. Chen and D. M. Tsai, 1996, “Simulation Optimization through Direct Search for Multi-Objective Manufacturing Systems,” Production Planning and Control, Vol. 17, pp. 554-565. (SCI) 

57.       D. M. Tsai and R. Y. Tsai, 1996, “Use Neural Networks to Determine Matching Order for Recognizing Overlapping Objects,” Pattern Recognition Letters, Vol. 17, pp. 1077-1088. (SCI)

58.       M. C. Chen and D. M. Tsai, 1996, “A Simulated Annealing Approach for Optimization of Multi-pass Turning Operations,” International Journal of Production Research, Vol. 34, pp. 2803-2825. (SCI)

59.       D. M. Tsai and M. F. Chen, 1996, “A Fast Machine Vision Approach for Automatic Recognition of Industrial Parts,” International Journal of Production Research, Vol. 34, pp. 687-699. (SCI)

60.        D. M. Tsai, 1996, “Detecting and Locating Partially Occluded Planar Parts by Clustering,” IIE Transactions, Vol. 28, pp. 531-544; NSC82-0415-E-155-020. (SCI)

61.        D. M. Tsai and W. J. Lu, 1996, “Detecting and Locating Burrs of Industrial Parts,” International Journal of Production Research, Vol. 34, pp. 3187-3205; NSC82-0415-E-155-068. (SCI)

62.        M. F. Chen and D. M. Tsai, 1996, “Economic design of turning operations," Journal of the Chinese Institute of Industrial Engineers, Vol.13, pp.349-361.(in Chinese)

63.       D. M. Tsai, 1995, “A Three-Dimensional Machine Vision Approach for Automatic Robot Programming,” Journal of Intelligent and Robotic Systems, Vol. 12, pp. 23-48; NSC80-0415-E-155-02 and NSC81-0415-E-155-07. (SCI)

64.        D. M. Tsai and M. F. Chen, 1995, “Object Recognition by a Linear Weight Classifier,” Pattern Recognition Letters, Vol. 16, pp. 591-600. (SCI)

65.        D. M. Tsai, 1995, “A Fast Thresholding Selection Procedure for Multimodal and Unimodal Histograms,” Pattern Recognition Letters, Vol. 16, pp. 653-666. (SCI)

66.       D. M. Tsai and M. F. Chen, 1994“Curve Fitting Approach for Tangent Angle and Curvature Measurements,” Pattern Recognition, Vol. 27, pp. 699-711.

67.        D. M. Tsai, E. M. Malstrom and W. Kuo, “Physical Simulation of a Three 
    Dimensional Palletizing Heuristic,” International Journal of Production Research,Vol. 32, pp. 1159-1171, 1994.

68.       D. M. Tsai and M. J. Yao,  1993“A Line-Balance-Based Capacity Planning Procedure for Series-Type Robotic Assembly Line,” International Journal of Production Research, Vol. 31, pp. 1901-1920.

69.        D. M. Tsai, E. M. Malstrom and W. Kuo, “Three Dimensional Pallelization of
    Mixed Box Sizes,” IIE Transactions, Vol. Pp. 64-75, 1993. 

70.        D. M. Tsai and Y. H. Chen, “A Fast Histogram-Clustering Approach for Multi-level Thresholding,” Pattern Recognition Letters, Vol. 13, pp. 245-255, 1992.

71.        D. M. Tsai and E. M. Malstrom and H. D. Meeks, 1988, “A Two-Dimensional palletizing Procedure for Warehouse Loading Operations,” IIE Transactions, Vol. 20, pp. 418-425.

72.       R. H. Choi, E. M. Malstrom and D. M. Tsai, 1988,“Evaluating Lot-Sizing Methods in Multilevel Inventory System by Simulation,” Production and Inventory Management Journal, Vol. 29, pp. 4-10.

  研討會論文

1.     Wei-Chen Li, Du-Ming Tsai, Wei-Yao Chiu, and Ya-Hui Tsai, 2007, “Motion detection with a moving camera for mobile robot surveillance,”Proceedings of the 8th Asia Pacific Industrial Engineering & Management System and 2007 Chinese Institute of Industrial Engineers Conference (APIEMS & CIIE Conference 2007), Kaohsiung, Taiwan.

2.     Du-Ming Tsai, Su-Ta Chuang, Yan-Hsin Tseng, 2006, “Automatic defect inspection of patterned TFT-LCD panels using Fourier image reconstruction,” The International Conference on Industrial Engineering Theory, Application and Practice(IJIE), Nagoya, Japan.

3.      Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng and Yuan-Ruei Jhang,2006, “ Defect detection in low-contrast glass substrates using anisotropic diffusion,” The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.

4.      Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao and Chao-Hsuan Yen ,2006, “ Independent component analysis based filter design for defect detection in low-contrast textured images,” The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.

5.    Shin-Min Chao, Du-Ming Tsai and Ya-Hui Tsai, 2006,“Independent component analysis based motion detection for indoor surveillance,” The 36th International Conference on Computers and Industrial Engineering (CIE), Taipei, Taiwan.

6.    Chi-Jie Lu, Du-Ming Tsai, Chih-Chou Chiu and Yan-Hsin Tseng, 2006, “Independent component analysis based disturbance separation for statistical process control,” The 36th International Conference on Computers and Industrial Engineering (CIE), Taichung, Taiwan.

7.       曾彥馨、蔡篤銘, 2005,“Using independent component analysis based process monitoring in TFT-LCD manufacturing,”中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。

8.      趙新民、蔡篤銘, 2005,“An anisotropic diffusion-based defect detection for low-contrast LCD glass substrates,”中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。

9.      蔡篤銘、呂奇傑、林品杰, 2005,“應用獨立成份分析(ICA)濾波器於TFT-LCD面板之瑕疵檢測,” 中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。

10.       Shin-Min Chao and Du-Ming Tsai, 2005, “An anisotropic diffusion-based defect detection for backlight panels,” 6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.

11.       Du-Ming Tsai, Chi-Jie Lu, Ping-Chieh Lin and Yan-Hsin Tseng, 2005, “Defect detection of backlight panel surfaces using independent component analysis filering scheme,” 6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.

12.       趙新民、蔡篤銘, 2005,“Astronomical image restoration using anisotropic   diffusion,”第四屆資訊與管理應用研討會，元培技術學院，新竹市。

13.       Yan-Hsin Tseng and Du-Ming Tsai, 2005, “Using Independent Component Analysis for Process Monitoring in TFT-LCD Manufacturing,” The 3rd ANQ Congress & The 19th Asia Quality Symposium, Taipei, Taiwan, September 20-23.

14.       蔡篤銘、林品杰、曾彥馨, 2005, “應用獨立成份分析濾波器於背光板與TFT-LCD面板之瑕疵檢測,” 第五屆全國AOI論壇與展覽，交通大學，新竹市。

15.       Chi-Jie Lu and Du-Ming Tsai, 2004, “Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis,” 中國工業工程學會九十三年度年會暨學術研討會，成功大學，台南市。

16.       Chi-Jie Lu and Du-Ming Tsai, 2004, “Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD,” The Fifth Asia-pacific conference on Industrial Engineering and Management Systems, Gold Coast, Australia, December 12-15.

17.       曾彥馨、蔡篤銘, 2004, “應用機器視覺於TFT面板之表面瑕疵檢測與分類,” 第四屆全國AOI論壇與展覽，交通大學，新竹市。

18.       江行全、蔡篤銘、呂奇傑、朱建政、楊程翔，2004“應用機器視覺技術於臂章圖形之自動邊界偵測,” 第四屆全國AOI論壇與展覽，交通大學，新竹市。

19.       趙新民、蔡篤銘, 2003, “應用非線性擴散於非同質性紋路之濺鍍玻璃基板表面檢測,” 中國工業工程學會九十二年度年會暨學術研討會，建國科技大學，彰化市。

20.       Chi-Jie Lu, Du-Ming Tsai and Hsu-Nan Yen, 2002, "Automatic Defect Inspection for LCDs Using Singular Value Decomposition,” The Fourth Asia-pacific conference on Industrial Engineering and Management Systems, Taipei, Taiwan, December 18-22.

21.       Hsu-Nan Yen and Du-Ming Tsai, 2002, " An adaptive machine vision system for electronic components inspection,” Proceedings of IE&EM’2002 & IceCE’2002 and Enterprise Management (IE&EM’2002), RID215, 1-8, Beijing, China.

22.       蔡篤銘、顏旭男及謝坤翰, 2001, “應用準確白光相移技術於BGA共平面之檢測,” 中國工業工程學會學術研討會，義守大學，高雄縣。

23.       蔡篤銘、顏旭男及謝坤翰,2001, “應用白光相位移技術於BGA高度之檢測,” 2001年PCB製造技術研討會, 元智大學，中壢市。

24.       Du-Ming Tsai and Chi-Hao Yeh,2000, “Ball Grid Array (BGA) substrate inspection by 1-D wavelet-transform,” The 5th Annual International Conference on Industrial Engineering – Theory, Applications and Practice.

25.       Du-Ming Tsai and B. Hsiao, “Defect detection using wavelet reconstruction,” The 13th IPPR Conference on Computer Vision, Graphics and Image Processing, 2000.

26.       Du-Ming Tsai and S. K. Wu,1999, “Automated surface inspection using Gabor filters,” 12th IPPR Conference on Computer Vision, Graphics and Image Processing,.