Publications

[Journal Papers]

[Conference]

[Technical Reports (full-text available)]


Journal Papers

  1.       蔡篤銘、任柏澔、徐子桓, 2022,” 無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測,” 影像與識別 , Vol. 28, p.p.90-117

  2.       Fan, S. K. S., Tsai, D. M., Jen, C. H., Hsu, C. Y., He, F., & Juan, L. T., 2021,” Data Visualization of Anomaly Detection in Semiconductor Processing Tools,” IEEE Transactions on Semiconductor Manufacturing, 35(2), 186-197.

  3.       Tsai, D. M., Fan, S. K. S., & Chou, Y. H. ,2021,”  Auto-annotated deep segmentation for surface defect detection,”  IEEE Transactions on Instrumentation and Measurement, 70, 1-10.

  4.       Du-Ming Tsai, Yi-Quan Huang and Wei-Yao Chiu, 2021,” Coffee plantation area recognition in satellite images using Fourier transform,” Measurement Science and Technology  vol. 32 (Accept)

  5.       Saul A. Reynoso Farnes; Du-Ming Tsai; Wei-Yao Chiu, 2021,” Autofocus Measurement for Electronic Components Using Deep Regression,”IEEE Transactions on Components, Packaging and Manufacturing Technology vol. 11 (Accept)

  6.       Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou, 2020,” Auto-annotated deep segmentation for surface defect detection,”IEEE Transactions on Instrumentation and Measurement  vol. 70, pp.115-127

  7.       Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fe He, Chun-Chung Cheng, 2020,” Data-driven approach for fault detection and diagnostic in semiconductor manufacturing,”IEEE Transactions on Automation Science and Engineering  vol. 17, pp.1925-1936

  8.       D. M. Tsai, Y. H. Chou, 2020,” Fast and precise positioning in PCBs using deep neural network regression,”IEEE Transactions on Instrumentation and Measurement  vol. 69, pp.4692-4701

  9.       D. M. Tsai, C. K. Huang , 2019,” Defect detection in electronic surfaces using template-based Fourier image reconstruction,”IEEE Transactions on Components, Packing, and Manufacturing Technology  vol. 9, pp.163-172

  10.       S.-K. Fan, D.-M. Tsai, F. He, R.-Y. Huang, C.-H, 2019,” Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques,”IEEE Transactions on Semiconductor Manufacturing vol. 32, pp.544-552

  11.       D. M. Tsai, Daniel E. Rivera Molina , 2019,” Morphology-based defect detection in machined surfaces with circular tool-mark patterns,”Measurement  vol. 134, pp.209-217

  12.       D. M. Tsai, Y. C. Hsieh , 2018,” Machine vision-based positioning and inspection using expectation- maximization technique,”IEEE Transactions on Instrumentation and Measurement  vol. 66, pp.2585-2868  

  13.       D. M. Tsai,  W. L. Chen, 2017,” Coffee plantation area recognition in satellite images using Fourier transform,”Computers and Electronics in Agriculture vol. 135, pp.115-127  

  14.      D. M. Tsai,  Y. C. Hsieh, 2017, ” Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique,” IEEE Trans. Instrumentation and Measurement, vol. 66, pp.2858-2868

  15.      D. M. Tsai,  G. N. Li, W. C. Li, W. Y. Chiu,2015,”Defect detection in multi-crystal solar cells using clustering with uniformity measures,” Advanced Engineering Informatics vol. 29, pp.419-430.

  16.      D. M. Tsai, W. Y. Chiu and M. H. Lee,2014,” Optical flow-motion history image (OF-MHI) for action recognition,” Signal, Image and Video Processing . (SCI)

  17.      D. M. Tsai, H. Hsu and W. Y. Chiu, 2014, “3-D vision-assist guidance for robots or the visually impaired,” Industrial Robot: An International Journal, vol. 4, pp.351-364. (SCI)   

  18.      D. M. Tsai, and W. Y. Chiu, 2014, "Action performance evaluation in video sequences," Imaging Science Journal. (SCI)

  19.      D. M. Tsai, C. Y. Hung, 2014, “A motion and image analysis method for automatic detection of estrus and mating behavior in cattle,” Computers and Electronics in Agriculture, vol. 104, pp.25-31

  20.      D. M. Tsai and M. C. Lin, 2013, "Machine-vision-based identification for wafer tracking in solar cell manufacturing," Robotics and Computer Integrated Manufacturing,vol.29, pp. 312–321. (SCI)

  21.       D. M. Tsai and T. H. Tseng, 2013, "A template reconstruction scheme for moving object detection from a mobile robot," Industrial Robot: An International Journal, vol. 40, pp.559 - 573 (SCI)

  22.       D. M. Tsai, S. C. Wu and W. Y. Chiu, 2013, “Defect Detection in Solar Modules Using ICA Basis Images,” IEEE Transactions on Industrial Informatics, vol. 9, pp.122-131. (SCI)

  23.       W. Y. Chiu and D. M. Tsai, 2013, “Moving/motionless foreground object detection using fast statistical background updating,” Imaging Science Journal, vol. 61,  pp. 252-267. (SCI)

  24.       W. Y. Chiu and D. M. Tsai, 2012, “Dual-mode detection for foreground segmentation in low-contrast video images,” Journal of Real-Time Image Processing.vol.9, pp.647-659 (SCI)    

  25.       W. C. Li and D. M. Tsai,  2012, “Wavelet-based defect detection in solar wafer images with inhomogeneous texture,” Pattern Recognition, vol. 45, pp.742-756.  (SCI)

  26.       D. M. Tsai, S. C. Wu, W. C. Li, 2012, “Defect detection of solar cells in electroluminescence images using Fourier image reconstruction,” Solar Energy Materials & Solar Cells, vol. 99, pp. 250-262. (SCI)

  27.       D. M. Tsai, M. C. Chen, W. C. Li, W. Y. Chiu, 2012, “A fast regularity measure for surface defect detection,” Machine Vision and Applications, vol. 23, pp. 869-886. (SCI)

  28.       D. M. Tsai, I. Y. Chiang, and Y. H. Tsai, 2012, “A shift-tolerant dissimilarity measure for surface defect detection,” IEEE Transactions on Industrial Informatics, vol. 8,  pp. 128-137. (SCI)

  29.       W. C. Li and D. M. Tsai, 2011, “Automatic saw-mark detection in multicrystalline solar wafer images,” Solar Energy Materials and Solar cells, vol. 95, pp. 2206-2220. (SCI)

  30.       W. C. Li and D. M. Tsai, 2011, “Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection,” IEEE Transactions on Industrial Informatics, vol. 7, pp. 136-147. (SCI)

  31.       D. M. Tsai and C. C. Lin, 2011, “Fuzzy C-means based clustering for linearly and nonlinearly separable data,” Pattern Recognition, vol. 44, pp. 1750-1760.(SCI)

  32.       D. M. Tsai and J. Y. Luo, 2011, “Mean shift-based defect detection in multicrystalline solar wafer surfaces,” IEEE Transactions on Industrial Informatics, vol. 7, pp. 125-135. (SCI)

  33.       Y. H. Tsai, D. M. Tsai, W. C. Li, W. Y. Chiu and M. C. Lin, 2011, “Surface defect detection of 3D objects using robot vision,” Industrial Robot, vol. 38,  pp. 381-398. (SCI)

  34.       D. M. Tsai and H. Y. Tsai, 2011, “Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis,”  Machine Vision and Applications, vol. 22, pp. 629-649.

  35.       S. M. Chao and D. M. Tsai, 2010, “An improved anisotropic diffusion model for detail- and edge-preserving smoothing,” Pattern Recognition Letters, vol. 31, pp. 2012-2023.  (SCI)

  36.      W. Y. Chiu and D. M. Tsai, 2010, “A macro-observation scheme for abnormal event detection in daily-life video sequences,” EURASIP Journal on Advances in Signal Processing, vol. 2010, Article ID 525026, 19 pages. (SCI)

  37.       S. M. Chao and D. M. Tsai, 2010, “Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images,” Pattern Recognition, vol. 43, pp. 1917-1931. (SCI)

  38.       D. M. Tsai, C. C. Chang, and S. M. Chao, 2010, “Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion,” Image and Vision Computing, vol. 28, pp. 491-501. (SCI)

  39.       Y. H. Tseng and D. M. Tsai, 2010, “Defect detection of uneven brightness in low-contrast images using basis image representation,” Pattern Recognition, vol. 43, pp. 1129-1141. (SCI)

  40.       D. M. Tsai and Y. J. Su, 2009, “ Non-referential, self-compared shape defect inspection for bond pads with deformed shapes,” International Journal of Production Research, vol. 47, pp. 1225-1244. (SCI)

  41.       D. M. Tsai and S. C. Lai, 2009, “Independent component analysis-based background subtraction for indoor surveillance,” IEEE Transactions on Image Processing, vol. 18, pp. 158-167. (SCI)

  42.       D. M. Tsai and W. Y. Chiu, 2008, “Motion detection using Fourier image reconstruction,” Pattern Recognition Letters, vol. 29, pp. 2145-2155. (SCI)

  43.       H. N. Yen, D. M. Tsai and S. K Feng, 2008, “Full-field 3D flip-chip solder bumps measurement using DLP-based phase shifting technique,” IEEE Transactions on Advanced Packaging, vol. 31, pp. 830-840. (SCI)

  44.       D. M. Tsai and S. T. Chuang, 2008, “1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations,”  Machine Vision and Applications, vol. 20, pp. 423-434. (SCI)

  45.       D. M. Tsai and S. C. Lai, 2008, “Defect detection in periodically patterned surfaces using independent component analysis,” Pattern Recognition, vol. 41, pp. 2812-2832. (SCI)

  46.       S. M. Chao and D. M. Tsai, 2008, “An anisotropic diffusion-based defect detection for low-contrast glass substrates,” Image and Vision Computing, vol. 26, pp. 187-200. (SCI, EI)

  47.       C. J. Lu and D. M. Tsai, 2008, “Independent component analysis-based defect detection in patterned liquid crystal display surfaces,” Image and Vision Computing, vol. 26, pp. 955-970. (SCI)

  48.       D. M. Tsai and C. C. Kuo, 2007, “Defect detection in homogeneously textured sputtered surfaces using 3D Fourier image reconstruction,” Machine Vision and Applications, vol. 18, pp. 383-400. (SCI)

  49.       D. M. Tsai, S. T. Chuang and Y. H. Tseng, 2007, “One-dimensional based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction,” International Journal of Production Research, vol. 45, pp. 1297-1321. (SCI)

  50.       D. M. Tsai, P. C. Lin and C. J. Lu, 2006, “An independent component analysis-based filter design for defect detection in low-contrast surface images ,” Pattern Recognition, vol. 39, pp. 1679-1694. (SCI)

  51.       S. M. Chao and D. M. Tsai, 2006,Astronomical image restoration using an improved anisotropic diffusion,” Pattern Recognition Letters, vol. 27, pp. 335-344. (SCI) 

  52.       H.  N. Yen, D. M. Tsai and J. Y. Yang, 2006,Full-field 3D measurement of solder pastes using LCD-based phase shifting techniques,” IEEE Transactions on Electronics Packaging Manufacturing, vol. 29, pp. 50-57. (SCI)

  53.       Y. H. Tseng and D. M. Tsai , 2006, “Using independent component analysis based process monitoring in TFT-LCD manufacturing,” Journal of the Chinese Institute of Industrial Engineers, vol. 23,  pp. 262-267. (EI)

  54.       D. M. Tsai and R. H. Yang, 2005, “An eigenvalue-based similarity measure and its application in defect detection, ” Image and Vision Computing,  vol. 23, pp. 1094-1101. (SCI)

  55.       D. M. Tsai and C. H. Yang, 2005, “A quantile-quantile plot based pattern matching for defect detection,” Pattern Recognition Letters, vol. 26, pp. 1948-1962. (SCI)

  56.       D. M. Tsai and C. Y. Hung, 2005, Automatic defect inspection of patterned TFT-LCD panels using 1-D Fourier reconstruction and wavelet decomposition, International Journal of Production Research, vol. 43,  pp. 4589-4607. (SCI)

  57.       D. M. Tsai, C. P. Lin and K. T. Huang, 2005, Defect detection in colored texture surfaces using Gabor filters, The Imaging Science Journal, vol. 53, pp. 27-37. (SCI)

  58.       D. M. Tsai and S. M. Chao, 2005, An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures, Image and Vision Computing, vol. 23, pp. 325-338. (SCI)

  59.       C. J. Lu and D. M. Tsai, 2005, “Automatic defect inspection for LCDs using singular value decomposition,” International Journal of Advanced Manufacturing Technology, vol. 25, pp. 53-61. (SCI)

  60.       E. Zahara, S. K. S. Fan. and D. M. Tsai, 2005, Optimal multi-thresholding using a hybrid optimization approach, Pattern Recognition Letters, vol.26, pp. 1082-1095. (SCI)

  61.       C. J. Lu and D. M. Tsai, 2004, “Defect inspection of patterned TFT-LCD panels using a fast sub-image based SVD, International Journal of Production Research, vol. 42, pp. 4331-4351. (SCI)

  62.       H. N. Yen and D. M. Tsai, 2004, “A fast full-field 3D measurement system for BGA coplanarity inspection,” International Journal of Advanced Manufacturing Technology, vol. 24, pp. 132-139. (SCI)

  63.       D. M. Tsai, C. T. Lin and J. F. Chen, 2003, “The evaluation of normalized cross correlations for defect detection,” Pattern Recognition Letters, vol. 24, pp. 2525-2535. (SCI)

  64.       D. M. Tsai and C. T. Lin, 2003, “Fast normalized cross correlation for defect detection,” Pattern Recognition Letters, vol. 24, pp. 2625-2631. (SCI)

  65.        D. M. Tsai and T. Y. Huang, 2003, “Automated surface inspection for statistical textures,” Image and Vision Computing, vol. 21, pp. 307-323. (SCI)

  66.          D. M. Tsai and C .H. Chiang, 2003, “Automatic band selection for wavelet reconstruction in the application of defect detection,” Image and Vision Computing, vol. 21, pp. 413-431. (SCI)

  67.       D.M. Tsai, T.Y. Huang, 2003, “Automated surface inspection for statistical textures,” Image and Vision Computing, vol. 21, pp.307-323

  68.       D. M. Tsai and C. C. Chou, 2003, “A fast focus measure for video display inspection,” Machine Vision & Applications, vol. 14, pp.192-196.

  69.         K. H. Hsiehn and D. M. Tsai, 2003, “A non-referential machine vision approach for BGA substrate inspection,” Journal of the Chinese Institute of Industrial Engineers, vol. 20, pp. 125-138.

  70.       D. M. Tsai and Y. H. Tsai, 2003, “Defect detection in textured surfaces using color ring-projection correlation,” Machine Vision and Applications, vol. 13, pp. 194-200.

  71.        D. M. Tsai and B. T. Lin, 2002, “Defect detection of gold-plated surfaces on PCBs using entropy measures,” International Journal of Advanced Manufacturing Technology, vol. 20, pp. 420-428.

  72.       D.M. Tsai, Y.H. Tsai, 2002, “Rotation-invariant pattern matching with color ring-projection,” Pattern Recognition, vol. 35, pp.131-141

  73.       D.M. Tsai, C.H. Chiang, 2002, “Rotation-invariant pattern matching using wavelet decomposition,” Pattern Recognition Letters, vol. 23, pp.191-201

  74.       D. M. Tsai and C. P. Lin, 2002,Fast defect detection in textured surfaces unsing 1D Gabor filters,” International Journal of Advanced Manufacturing Technology, vol. 20, pp. 664-675.

  75.        D. M. Tsai and C. H. Chiang, 2002, “Rotation-invariant pattern matching using wavelet decomposition,” Pattern Recognition Letters, vol. 23, pp. 191-201. (SCI)

  76.        D. M. Tsai and Y. H. Tsai, 2002, “Rotation-invariant pattern matching with color ring-projection,” Pattern Recognition, vol. 35, pp. 131-141.

  77.       C.H. Yeh, D.M. Tsai, 2001, “Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection,” International Journal of Production Research, vol. 39, pp.4281-4299

  78.       C. H. Yeh and D. M. Tsai, 2001, “Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection,” International Journal of Production Research, vol. 39, pp. 4281-4299. (SCI)

  79.       D. M. Tsai and B. Hsiao, 2001, “Automatic surface inspection using wavelet reconstruction,” Pattern Recognition, vol. 34, pp. 1285-1305. (SCI)

  80.       D. M. Tsai, S. K. Wu and M. C. Chen, 2001, “Optimal Gabor filter design for texture segmentation using stochastic optimization,” Image and Vision Computing, vol. 19, pp. 299-316. (SCI)   

  81.         C. H. Yeh and D. M. Tsai, 2001, “A rotation-invariant and nonreferential approach for ball grid array (BGA) substrate conduct paths inspection,” International Journal of Advanced Manufacturing Technology, vol. 17, pp. 412-424. (SCI) 

  82.       C.H. Yeh, D.M. Tsai, 2001, “A rotation-invariant and non-referential approach for ball grid array (BGA) substrate conducting path inspection,” International Journal of Advanced Manufacturing Technology, vol. 17, pp.412-424

  83.        D. M. Tsai and S. K. Wu, 2000, “Automated surface inspection using Gabor filters,” International Journal of Advanced Manufacturing Technology , vol. 16, pp. 474-482. (SCI)

  84.       D. M. Tsai and C. Y. Hsieh, 1999, “Automated surface inspection for directional textures,” Image and Vision Computing, vol. 18, pp. 49-62. (SCI)

  85.       S. M. Guu and D. M. Tsai, 1999, “Measurement of roundness: a nonlinear approach,” Proc. Natl. Sci. Counc. ROC(A), vol. 23, pp. 348-352.

  86.        P. K. Wang and D. M. Tsai, 1999, “Machine vision for leadframe process quality monitoring,” Journal of the Chinese Institute of Industrial Engineers, vol.16, pp. 533-549; NSC88-2212-E-155-010. (in Chinese)

  87.        D. M. Tsai and C. F. Tseng, 1999, “Surface roughness classification for castings,” Pattern Recognition, vol. 32, pp. 389-405; NSC88-2213-E-155-013. (SCI) 

  88.       D. M. Tsai, 1999, “A machine vision approach for detecting and inspecting circular parts,” International Journal of Advanced Manufacturing Technology, vol. 15, pp. 217-221. (SCI) 

  89.         D. M. Tsai, H.-T. Hou and H.-J. Su, 1999, “Boundary-based corner detection using eigenvalues of covariance matrices,” Pattern Recognition Letters, vol. 20, pp. 31-40. (SCI) 

  90.        M. C. Chen, D. M. Tsai and H. Y. Tseng, 1999, “A stochastic optimization approach for roundness measurements,” Pattern Recognition Letters, vol. 20, pp. 707-719. (SCI)

  91.       Chen, M.-C., D. M. Tsai, Tseng, H.-Y., 1999, “A stochastic optimization approach for roundness measurements,” Pattern Recognition Letters, vol. 20, pp.707-719. (SCI)

  92.       Guu, Sy-Ming, D. M. Tsai, 1999, “Measurement of roundness: A nonlinear approach,” Proceedings of the National Science Council, Republic of China, Part A: Physical Science and Engineering, vol. 23, pp.348-352. (SCI)

  93.       D. M. Tsai, 1999, “Machine vision approach for detecting and inspecting circular parts,” International Journal of Advanced Manufacturing Technology, vol. 15, pp.217-221. (SCI)

  94.         D. M. Tsai and H. J. Wang, 1998, “Segmenting focused objects in complex visual images,” Pattern Recognition Letters, vol. 19, pp. 929-940. (SCI) 

  95.       D. M. Tsai, J. J. Chen and J. F. Chen, 1998, “A vision system for surface roughness assessment using neural networks,” International Journal of Advanced Manufacturing Technology, vol. 14, pp. 412-422; NSC87-2213-E-155-021. (SCI) 

  96.       D. M. Tsai, Wang, H.-J., 1998, “Segmenting focused objects in complex visual images,” Pattern Recognition Letters, vol. 19, pp.929-940. (SCI)

  97.       D. M. Tsai, C. Y. Chien and P. K. Wang, 1998, “Model based 3D parts recognition from a single image,” Journal of the Chinese Institute of Industrial Engineers, vol. 15, pp. 523-532; NSC85-2212-E-155-010.(in  Chinese)

  98.       D. M. Tsai and C. T. Lin, 1998, “A moment-preserving approach for depth from defocus,” Pattern Recognition, vol. 31, pp. 551-560; NSC87-2212-E-155-006. (SCI)

  99.       D. M. Tsai, 1997, “An improved generalized Hough transform for the recognition of overlapping objects,” Image and Vision Computing, vol. 15, pp. 887-888; NSC84-2213-E-155-002. (SCI)

  100.        D. M. Tsai, and J. I. Tzeng, 1997, “Dimensional and angular measurements using least squares and neural networks,” International Journal of Advanced Manufacturing Technology, vol. 13, pp. 55-66; NSC86-2213-E-155-003. (SCI)

  101.       D. M. Tsai, 1997, “An improved generalized Hough transform for the recognition of overlapping objects,” Image and Vision Computing, vol. 15, pp.877-888. (SCI)

  102.       D. M. Tsai, 1997, “Boundary-based corner detection using neural networks,” Pattern Recognition, vol. 30, pp. 85-97. (SCI)

  103.       D. M. Tsai, Lu, W.-J., 1996, ” Detecting and locating burrs of industrial parts,” International Journal of Production Research, vol. 34, pp. 3187-3205. (SCI)

  104.       D. M. Tsai, 1996, “Locating overlapping industrial parts for robotic assembly,” International Journal of Advanced Manufacturing Technology, vol. 12, pp. 288-302; NSC83-0415-E-155-033. (SCI)

  105.       M. C. Chen and D. M. Tsai, 1996, “Simulation optimization through direct search for multi-objective manufacturing systems,” Production Planning and Control, vol. 7, pp. 554-565. (SCI) 

  106.       Chen, M.-C., D. M. Tsai, 1996, “A simulated annealing approach for optimization of multi-pass turning operations,” International Journal of Production Research, vol. 34, pp.2803-2825. (SCI)

  107.       D. M. Tsai and R. Y. Tsai, 1996, “Use neural networks to determine matching order for recognizing overlapping objects,” Pattern Recognition Letters, vol. 17, pp. 1077-1088. (SCI)

  108.       D. M. Tsai, 1996,” Locating overlapping industrial parts for robotic assembly,” International Journal of Advanced Manufacturing Technology, vol. 12, pp.288-302.(SCI)

  109.       M. C. Chen and D. M. Tsai, 1996, “A simulated annealing approach for optimization of multi-pass turning operations,” International Journal of Production Research, vol. 34, pp. 2803-2825. (SCI)

  110.       D. M. Tsai and M. F. Chen, 1996, “A fast machine vision approach for automatic recognition of industrial parts,” International Journal of Production Research, vol. 34, pp. 687-699. (SCI)

  111.        D. M. Tsai, 1996, “Detecting and locating partially occluded planar parts by clustering,” IIE Transactions, vol. 28, pp. 531-544; NSC82-0415-E-155-020. (SCI)

  112.        D. M. Tsai and W. J. Lu, 1996, “Detecting and locating burrs of industrial parts,” International Journal of Production Research, vol. 34, pp. 3187-3205; NSC82-0415-E-155-068. (SCI)

  113.        M. F. Chen and D. M. Tsai, 1996, “Economic design of turning operations,” Journal of the Chinese Institute of Industrial Engineers, vol. 13, pp. 349-361. (in Chinese)

  114.       D. M. Tsai, 1995, “A three-dimensional machine vision approach for automatic robot programming,” Journal of Intelligent and Robotic Systems, vol. 12, pp. 23-48; NSC80-0415-E-155-02 and NSC81-0415-E-155-07. (SCI)

  115.       D. M. Tsai, 1995, “A fast thresholding selection procedure for multimodal and unimodal histograms,” Pattern Recognition Letters, vol. 16, pp. 653-666. (SCI)

  116.        D. M. Tsai and M. F. Chen, 1995, “Object recognition by a linear weight classifier,” Pattern Recognition Letters, vol. 16, pp. 591-600. (SCI)

  117.       D. M. Tsai and M. F. Chen, 1994, “Curve fitting approach for tangent angle and curvature measurements,” Pattern Recognition, vol. 27, pp. 699-711.

  118.      D. M. Tsai, E. M. Malstrom and W. Kuo,1994, “Physical simulation of a three dimensional palletizing heuristic,” International Journal of Production Research, vol. 32, pp. 1159-1171. (SCI)

  119.       D. M. Tsai and M. J. Yao,  1993, “A line-balance-based capacity planning procedure for series-type robotic assembly line,” International Journal of Production Research, vol. 31, pp. 1901-1920. (SCI)

  120.       D. M. Tsai, E. M. Malstrom and W. Kuo, 1993, “Three dimensional palletization of mixed box sizes,” IIE Transactions, vol. 25, pp. 64-75. 

  121.       D. M. Tsai, Yao, Ming-Jong, 1993, “Line-balance-based capacity planning procedure for series-type robotic assembly line,” International Journal of Production Research, vol. 31, pp.1901-1920. (SCI)

  122.        D. M. Tsai and Y. H. Chen, 1992, “A fast histogram-clustering approach for multi-level thresholding,” Pattern Recognition Letters, vol. 13, pp. 245-252. (SCI)

  123.        D. M. Tsai and E. M. Malstrom and H. D. Meeks, 1988,  “A two-dimensional palletizing procedure for warehouse loading operations,” IIE Transactions, vol. 20, pp. 418-425.

  124.       R. H. Choi, E. M. Malstrom and D. M. Tsai, 1988, “Evaluating lot-sizing methods in multilevel inventory system by simulation,” Production and Inventory Management Journal, vol. 29, pp. 4-10.


Conference

  1.       D. M. Tsai, H.-Y Tsai, W.-Y. Chiu, 2019,"Mura defect inspection in Liquid Crystal Display panels using optical flow-based motion analysis, "The 20th Asia Pacific Industrial Engineering and Management Science Conference.

  2.       D. M. Tsai, Shu-Kai Fan, Yi-Quan Huang, 2019,"Saw-mark defect detection in heterogeneous solar wafer images using GAN-based Training Samples Generation and CNN Classification , " VISAPP.

  3.       D. M. Tsai, Yan-Hsin Tseng, 2018,"Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction, "The Fourteenth International Conference on Autonomic and Autonomous Systems, France.

  4.      D. M. Tsai, Shu-Kai S. Fan, Chih-Hung Jen, Rui-Yu Huang and Kuan-Lung Chen , 2016,"Key parameter identification for faulty wafer detection using image processing, "ICAS .

  5.       D. M. Tsai, Wan-Ling Chen, 2018,"Segmentation of coffee plantation area in satellite image using Fourier feature, "The 19th Asia-Pacific Industrial Engineering and Management Systems Conference, HK,

  6.       Du-Ming Tsai, Wei-Yao Chiu, 2017, "Automated visual inspection of multicrystalline solar wafer using wavelet discrimination measure, "The 18th Asia Pacific Industrial Engineering and Management Systems Conference, Indonesia.

  7.       Du-Ming Tsai, I-Yung Chiang and Wei-Yao Chiu, 2016,"Optical-flow-based
    template matching for surface defect detection, "International Congress on
    Engineering and Information, Japan.

  8.       Du-Ming Tsai, Tzu-Hsun Tseng and Wei-Yao Chiu, 2015, "Surface defect
    detection in low-contrast images using basis image representation, "IAPR
    International Conference on Machine Vision Applications, Japan.

  9.       Du-Ming Tsai, Wei-Yao Chiu and Tzu-Hsun Tseng, 2015, "Moving object
    detection from a mobile robot using basis image matching, "IS&T/SPIE
    Electronic Imaging, USA.

  10.       Du-Ming Tsai,  Yi-Jun Xie,2015,"Automatic Crack Detection in Textured Metal
    Surfaces Using Machine Vision, "The 16th Asia Pacific Industrial Engineering
    and Management Science Conference, Vietnam.

  11.       Du-Ming Tsai, Yan-Hsin Tseng and Wei-Yao Chiu, 2014,"Automatic defect inspection of TFT-LCD panels using Fourier image reconstruction, "The 15th Asia Pacific Industrial Engineering and Management Science Conference(APIEMS 2014), Jeju, Korea.

  12.       Du-Ming Tsai,Wei-Yao Chiu and Jie-Yu Luo,2014,” Automatic visual inspection of solar wafers using mean-shift techniques,” The Annual Conference on Engineering and Information Technology (ACEAIT 2014), Tokyo , Japan.

  13.       Du-Ming Tsai, Shih-Chieh Wu and Wei-Yao Chiu, 2013, "Automatic visual inspection of solar modules using Independent component analysis,"The 14th Asia Pacific Industrial Engineering and Management Science Conference(APIEMS 2013),Cebu,Philippines.     

  14.       Du-Ming Tsai, Wei-Yao Chiu, 2013,"A real-time ICA-based activity recognition in video sequences,"MVA2013(IAPR International Conference on Machine Vision Applications),Kyoto,Japan.

  15.       Du-Ming Tsai, Wei-Yao Chiu, 2013,"Dual-mode Detection for Foreground Segmentation in Low-Contrast Video Images,"
    VISIGRAPP2013(8th Int’l. Joint Conf. on Computer Vision, Imaging and Computer Graphics Theory and Applications), Barcelona,Spain.

  16.       Du-Ming Tsai, I-Yung Chiang, Hao Hsu and Wei-Yao Chiu, 2012, "A Shift-tolerant Dissimilarity Measure for Surface Defect Detection," The 13th Asia Pacific Industrial Engineering and Management Systems Conference, Phuket, THAILAND.

  17.       Du-Ming Tsai, Wei-Yao Chiu, and Ming-Chun Chen, 2012, “A PCA-based regularity measure for surface defect inspection,” The Institute of Industrial Engineers Asian Conference, Singapore.

  18.       Wei-Yao Chiu and Du-Ming Tsai, 2012, “ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds,”7th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2012), Rome, Italy.

  19.      Wei-Chen Li and Du-Ming Tsai, 2011, “Automatic Saw-Mark Detection in Multicrystalline Solar Wafer Images,” The 12th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2011), Beijing, China.

  20.       S.M. Chao, D.M. Tsai, 2010, “Anisotropic diffusion-based detail-preserving smoothing for image restoration,” Proceedings - International Conference on Image Processing, ICIP, pp.4145-4148

  21.        Wei-Yao Chiu and Du-Ming Tsai, 2010, “A macro-observation approach of intelligence video surveillance for real-time unusual event detection,” The 2010 International Symposium on Service, Security and its Data management technologies in Ubi-com (SSDU), Xi’an, China.

  22.       Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li and Wei-Yao Chiu, 2010, “A generalized anisotropic diffusion for defect detection in low-contrast surfaces,” 20th International Conference on Pattern Recognition(ICPR), Istanbul, Turkey.

  23.       Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu and Wei-Chen Li, 2010, “Anisotropic diffusion-based detail-preserving smoothing for image restoration,” 2010 International Conference on Image Processing(ICIP), The Hong Kong Convention and Exhibition Centre, Hong Kong.

  24.       Wei-Chen Li and Du-Ming Tsai, 2009, “Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection,” The 10th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2009), Kokura, Japan.

  25.       Du-Ming Tsai and Wei-Yao Chiu, 2009, “A Micro-observation Approach for Real-time Unusual Event Detection in Video,” The 12th IEEE International Conference on Computer Vision (ICCV), Kyoto, Japan.

  26.       Du-Ming Tsai, 2009, “Visual defect detection in low-contrast surfaces using anisotropic diffusion,” Siberian-Taiwan-Forum Proceedings, Tomsk, Russia.

  27.       Du-Ming Tsai, Yan-Jheng Su, and Wei-Yao Chiu, 2008 “Non-referential, self-compared shape defect inspection for PCB bond pads,” The 9th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2008), Bali, Indonesia.

  28.      蔡篤銘、蔡欣洋, 2008,“應用動態影像處理之光流法於液晶顯示器面板之Mura瑕疵檢測,”中國工業工程學會九十七年度年會暨學術研討會,中原大學,中壢市。

  29.      Wei-Chen Li, Du-Ming Tsai, Wei-Yao Chiu, and Ya-Hui Tsai, 2007, “Motion detection with a moving camera for mobile robot surveillance,” Proceedings of the 8th Asia Pacific Industrial Engineering & Management System and 2007 Chinese Institute of Industrial Engineers Conference (APIEMS & CIIE Conference 2007), Kaohsiung, Taiwan.

  30.       Du-Ming Tsai, Su-Ta Chuang, Yan-Hsin Tseng, 2006, “Automatic defect inspection of patterned TFT-LCD panels using Fourier image reconstruction,” The International Conference on Industrial Engineering Theory, Application and Practice(IJIE), Nagoya, Japan.

  31.       Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng and Yuan-Ruei Jhang,2006, “ Defect detection in low-contrast glass substrates using anisotropic diffusion,” The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.

  32.       Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao and Chao-Hsuan Yen ,2006, “ Independent component analysis based filter design for defect detection in low-contrast textured images,” The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.

  33.       Shin-Min Chao, Du-Ming Tsai and Ya-Hui Tsai, 2006, “Independent component analysis based motion detection for indoor surveillance,” The 36th International Conference on Computers and Industrial Engineering (CIE), Taipei, Taiwan.

  34.       Chi-Jie Lu, Du-Ming Tsai, Chih-Chou Chiu and Yan-Hsin Tseng, 2006, “Independent component analysis based disturbance separation for statistical process control,” The 36th International Conference on Computers and Industrial Engineering (CIE), Taichung, Taiwan.

  35.       曾彥馨、蔡篤銘, 2005,Using independent component analysis based process monitoring in TFT-LCD manufacturing,中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。

  36.       趙新民、蔡篤銘, 2005,An anisotropic diffusion-based defect detection for low-contrast LCD glass substrates,中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。

  37.       蔡篤銘、呂奇傑、林品杰, 2005,“應用獨立成份分析(ICA)濾波器於TFT-LCD面板之瑕疵檢測, 中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。

  38.       Shin-Min Chao and Du-Ming Tsai, 2005, “An anisotropic diffusion-based defect detection for backlight panels,”  6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.

  39.       Du-Ming Tsai, Chi-Jie Lu, Ping-Chieh Lin and Yan-Hsin Tseng, 2005,  “Defect detection of backlight panel surfaces using independent component analysis filering scheme,”  6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.

  40.       趙新民、蔡篤銘, 2005,Astronomical image restoration using anisotropic   diffusion,第四屆資訊與管理應用研討會,元培技術學院,新竹市。

  41.       Yan-Hsin Tseng and Du-Ming Tsai, 2005, Using Independent Component Analysis for Process Monitoring in TFT-LCD Manufacturing, The 3rd ANQ Congress & The 19th Asia Quality Symposium, Taipei, Taiwan, September 20-23.

  42.       蔡篤銘、林品杰、曾彥馨, 2005,“應用獨立成份分析濾波器於背光板與TFT-LCD面板之瑕疵檢測,” 第五屆全國AOI論壇與展覽,交通大學,新竹市。

  43.       Chi-Jie Lu and Du-Ming Tsai, 2004,  “Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis,”  中國工業工程學會九十三年度年會暨學術研討會,成功大學,台南市。

  44.       Chi-Jie Lu and Du-Ming Tsai, 2004,  “Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD,”  The Fifth Asia-pacific conference on Industrial Engineering and Management Systems, Gold Coast, Australia, December 12-15.

  45.       曾彥馨、蔡篤銘, 2004, “應用機器視覺於TFT面板之表面瑕疵檢測與分類,” 第四屆全國AOI論壇與展覽,交通大學,新竹市。

  46.       江行全、蔡篤銘、呂奇傑、朱建政、楊程翔,2004應用機器視覺技術於臂章圖形之自動邊界偵測,” 第四屆全國AOI論壇與展覽,交通大學,新竹市。

  47.       趙新民、蔡篤銘, 2003, “應用非線性擴散於非同質性紋路之濺鍍玻璃基板表面檢測,” 中國工業工程學會九十二年度年會暨學術研討會,建國科技大學,彰化市。

  48.       Chi-Jie Lu, Du-Ming Tsai and Hsu-Nan Yen, 2002, Automatic Defect Inspection for LCDs Using Singular Value Decomposition,”  The Fourth Asia-pacific conference on Industrial Engineering and Management Systems, Taipei, Taiwan, December 18-22.

  49.       Hsu-Nan Yen and Du-Ming Tsai, 2002, An adaptive machine vision system for electronic components inspection,”  Proceedings of IE&EM’2002 & IceCE’2002 and Enterprise Management (IE&EM’2002), RID215, 1-8, Beijing, China.

  50.       蔡篤銘、顏旭男及謝坤翰, 2001, “應用準確白光相移技術於BGA共平面之檢測,” 中國工業工程學會學術研討會義守大學,高雄縣。

  51.       蔡篤銘、顏旭男及謝坤翰,2001, “應用白光相位移技術於BGA高度之檢測,” 2001PCB製造技術研討會, 元智大學,中壢市。

  52.       Du-Ming Tsai and Chi-Hao Yeh,2000,  “Ball Grid Array (BGA) substrate inspection by 1-D wavelet-transform,”  The 5th Annual International Conference on Industrial Engineering – Theory, Applications and Practice.

  53.       Du-Ming Tsai and B. Hsiao,  “Defect detection using wavelet reconstruction,”  The 13th IPPR Conference on Computer Vision, Graphics and Image Processing, 2000.

  54.       Du-Ming Tsai and S. K. Wu,1999,  “Automated surface inspection using Gabor filters,”  12th IPPR Conference on Computer Vision, Graphics and Image Processing,.

 


Technical Reports   

  Automated surface inspection
  PCB defect inspection
  LCD defect inspection
  Correlation-based defect detection
  Gabor-filter design for texture segmentation & inspection
  3D measurement system for electronic industries
  Shape recognition & measurement
  Depth from defocus & focus measure
  Corner detection
  Pattern matching for object detection and inspection

 

  Image restoration

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