-
蔡篤銘、任柏澔、徐子桓, 2022,” 無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測,” 影像與識別 ,
Vol. 28, p.p.90-117
-
Fan, S. K. S., Tsai, D. M., Jen, C. H., Hsu, C. Y., He,
F., & Juan, L. T., 2021,” Data Visualization of Anomaly
Detection in Semiconductor Processing Tools,” IEEE
Transactions on Semiconductor Manufacturing, 35(2),
186-197.
-
Tsai, D. M., Fan, S. K. S., & Chou, Y. H. ,2021,”
Auto-annotated deep segmentation for surface defect
detection,” IEEE Transactions on Instrumentation and
Measurement, 70, 1-10.
-
Du-Ming
Tsai, Yi-Quan Huang and Wei-Yao Chiu, 2021,” Coffee
plantation area recognition in satellite images using
Fourier transform,” Measurement Science and Technology
vol. 32 (Accept)
-
Saul A. Reynoso Farnes; Du-Ming Tsai; Wei-Yao Chiu,
2021,” Autofocus Measurement for Electronic Components
Using Deep Regression,”IEEE Transactions on Components,
Packaging and Manufacturing Technology vol. 11 (Accept)
-
Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou, 2020,”
Auto-annotated deep segmentation for surface defect
detection,”IEEE Transactions on Instrumentation and
Measurement vol. 70, pp.115-127
-
Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fe He,
Chun-Chung Cheng, 2020,” Data-driven approach for fault
detection and diagnostic in semiconductor manufacturing,”IEEE
Transactions on Automation Science and Engineering vol.
17, pp.1925-1936
-
D. M. Tsai, Y. H. Chou, 2020,” Fast and precise
positioning in PCBs using deep neural network regression,”IEEE
Transactions on Instrumentation and Measurement vol. 69, pp.4692-4701
-
D. M. Tsai, C. K. Huang , 2019,” Defect detection in
electronic surfaces using template-based Fourier image
reconstruction,”IEEE Transactions on Components,
Packing, and Manufacturing Technology vol. 9, pp.163-172
-
S.-K. Fan, D.-M. Tsai, F. He, R.-Y. Huang, C.-H, 2019,”
Key parameter identification and defective wafer
detection of semiconductor manufacturing processes using
image processing techniques,”IEEE Transactions on
Semiconductor Manufacturing vol. 32, pp.544-552
-
D. M. Tsai, Daniel E. Rivera Molina , 2019,”
Morphology-based defect detection in machined surfaces
with circular tool-mark patterns,”Measurement vol. 134, pp.209-217
-
D. M. Tsai, Y. C. Hsieh , 2018,” Machine vision-based
positioning and inspection using expectation-
maximization technique,”IEEE Transactions on
Instrumentation and Measurement vol. 66, pp.2585-2868
-
D. M. Tsai, W. L. Chen, 2017,”
Coffee plantation area recognition in satellite images
using Fourier transform,”Computers
and Electronics in Agriculture vol. 135, pp.115-127
-
D. M. Tsai, Y. C. Hsieh, 2017, ”
Machine Vision-Based Positioning and Inspection Using
Expectation-Maximization Technique,” IEEE Trans.
Instrumentation and Measurement, vol. 66, pp.2858-2868
-
D. M. Tsai, G. N. Li, W. C. Li, W. Y.
Chiu,2015,”Defect detection in multi-crystal solar cells
using clustering with uniformity measures,” Advanced
Engineering Informatics
vol. 29, pp.419-430.
-
D. M. Tsai, W. Y. Chiu and M. H. Lee,2014,”
Optical flow-motion history image (OF-MHI) for action
recognition,” Signal, Image and Video Processing .
(SCI)
-
D. M. Tsai, H. Hsu
and W. Y. Chiu, 2014, “3-D vision-assist guidance for
robots or the visually impaired,” Industrial Robot: An
International Journal, vol. 4, pp.351-364. (SCI)
-
D. M. Tsai, and W.
Y. Chiu, 2014, "Action performance evaluation in video
sequences," Imaging Science Journal.
(SCI)
-
D.
M. Tsai, C. Y. Hung, 2014, “A motion and image analysis
method for automatic detection of estrus and mating
behavior in cattle,” Computers and Electronics in
Agriculture, vol. 104, pp.25-31
-
D. M. Tsai and M. C.
Lin, 2013, "Machine-vision-based identification for
wafer tracking in solar cell manufacturing," Robotics
and Computer Integrated Manufacturing,vol.29, pp.
312–321. (SCI)
-
D. M. Tsai and T. H.
Tseng, 2013, "A template reconstruction scheme for
moving object detection from a mobile robot," Industrial
Robot: An International Journal, vol. 40, pp.559 -
573 (SCI)
-
D. M. Tsai, S. C. Wu
and W. Y. Chiu, 2013, “Defect Detection in Solar Modules
Using ICA Basis Images,” IEEE Transactions on Industrial
Informatics, vol. 9, pp.122-131. (SCI)
-
W. Y. Chiu and D. M.
Tsai, 2013, “Moving/motionless foreground object
detection using fast statistical background updating,”
Imaging Science Journal, vol. 61, pp. 252-267. (SCI)
-
W. Y. Chiu and
D. M. Tsai, 2012, “Dual-mode detection for foreground
segmentation in low-contrast video images,” Journal of
Real-Time Image Processing.vol.9,
pp.647-659
(SCI)
-
W. C. Li and D. M.
Tsai, 2012, “Wavelet-based defect detection in solar
wafer images with inhomogeneous texture,” Pattern
Recognition, vol. 45, pp.742-756. (SCI)
-
D. M. Tsai, S. C. Wu,
W. C. Li, 2012, “Defect detection of solar cells in
electroluminescence images using Fourier image
reconstruction,” Solar Energy Materials & Solar Cells,
vol. 99, pp. 250-262. (SCI)
-
D. M. Tsai, M. C.
Chen, W. C. Li, W. Y. Chiu, 2012, “A fast regularity
measure for surface defect detection,” Machine Vision
and Applications, vol. 23, pp. 869-886. (SCI)
-
D. M. Tsai, I. Y.
Chiang, and Y. H. Tsai, 2012, “A shift-tolerant
dissimilarity measure for surface defect detection,”
IEEE Transactions on Industrial Informatics, vol. 8,
pp. 128-137. (SCI)
-
W. C. Li and D. M.
Tsai, 2011, “Automatic saw-mark detection in
multicrystalline solar wafer images,” Solar Energy
Materials and Solar cells, vol. 95, pp. 2206-2220. (SCI)
-
W. C. Li and D. M.
Tsai, 2011, “Defect inspection in low-contrast LCD
images using Hough transform-based nonstationary line
detection,” IEEE Transactions on Industrial Informatics,
vol. 7, pp. 136-147. (SCI)
-
D. M. Tsai and C. C.
Lin, 2011, “Fuzzy C-means based clustering for linearly
and nonlinearly separable data,” Pattern Recognition,
vol. 44, pp. 1750-1760.(SCI)
-
D. M. Tsai and J. Y.
Luo, 2011, “Mean shift-based defect detection in
multicrystalline solar wafer surfaces,” IEEE
Transactions on Industrial Informatics, vol. 7, pp.
125-135. (SCI)
-
Y. H. Tsai, D. M.
Tsai, W. C. Li, W. Y. Chiu and M. C. Lin, 2011, “Surface
defect detection of 3D objects using robot vision,”
Industrial Robot, vol. 38, pp. 381-398. (SCI)
-
D. M. Tsai and H. Y.
Tsai, 2011, “Low-contrast surface inspection of mura
defects in liquid crystal displays using optical
flow-based motion analysis,” Machine Vision and
Applications, vol. 22, pp. 629-649.
-
S. M. Chao and D. M.
Tsai, 2010, “An improved anisotropic diffusion model for
detail- and edge-preserving smoothing,” Pattern
Recognition Letters, vol. 31, pp. 2012-2023. (SCI)
-
W. Y. Chiu and D. M.
Tsai, 2010, “A macro-observation scheme for abnormal
event detection in daily-life video sequences,” EURASIP
Journal on Advances in Signal Processing, vol. 2010,
Article ID 525026, 19 pages. (SCI)
-
S. M. Chao and D. M.
Tsai, 2010, “Anisotropic diffusion with generalized
diffusion coefficient function for defect detection in
low-contrast surface images,” Pattern Recognition, vol.
43, pp. 1917-1931. (SCI)
-
D. M. Tsai, C. C.
Chang, and S. M. Chao, 2010, “Micro-crack inspection in
heterogeneously textured solar wafers using anisotropic
diffusion,” Image and Vision Computing, vol. 28, pp.
491-501. (SCI)
-
Y. H. Tseng and D. M.
Tsai, 2010, “Defect detection of uneven brightness in
low-contrast images using basis image representation,”
Pattern Recognition, vol. 43, pp. 1129-1141. (SCI)
-
D. M. Tsai and Y. J.
Su, 2009, “ Non-referential, self-compared shape defect
inspection for bond pads with deformed shapes,”
International Journal of Production Research, vol. 47,
pp. 1225-1244. (SCI)
-
D. M. Tsai and S. C.
Lai, 2009, “Independent component analysis-based
background subtraction for indoor surveillance,” IEEE
Transactions on Image Processing, vol. 18, pp. 158-167.
(SCI)
-
D. M. Tsai and W. Y.
Chiu, 2008, “Motion detection using Fourier image
reconstruction,” Pattern Recognition Letters, vol. 29,
pp. 2145-2155. (SCI)
-
H. N. Yen, D. M. Tsai
and S. K Feng, 2008, “Full-field 3D flip-chip solder
bumps measurement using DLP-based phase shifting
technique,” IEEE Transactions on Advanced Packaging,
vol. 31, pp. 830-840. (SCI)
-
D. M. Tsai and S. T.
Chuang, 2008, “1D-based defect detection in patterned
TFT-LCD panels using characteristic fractal dimension
and correlations,” Machine Vision and Applications,
vol. 20, pp. 423-434. (SCI)
-
D. M. Tsai and S. C.
Lai, 2008, “Defect detection in periodically patterned
surfaces using independent component analysis,” Pattern
Recognition, vol. 41, pp. 2812-2832. (SCI)
-
S. M. Chao and D. M.
Tsai, 2008, “An anisotropic diffusion-based defect
detection for low-contrast glass substrates,” Image and
Vision Computing, vol. 26, pp. 187-200. (SCI, EI)
-
C. J. Lu and D. M.
Tsai, 2008, “Independent component analysis-based defect
detection in patterned liquid crystal display surfaces,”
Image and Vision Computing, vol. 26, pp. 955-970. (SCI)
-
D. M. Tsai and C. C.
Kuo, 2007, “Defect detection in homogeneously textured
sputtered surfaces using 3D Fourier image
reconstruction,” Machine Vision and Applications, vol.
18, pp. 383-400. (SCI)
-
D. M. Tsai, S. T.
Chuang and Y. H. Tseng, 2007, “One-dimensional based
automatic defect inspection of multiple patterned TFT-LCD
panels using Fourier image reconstruction,”
International Journal of Production Research, vol. 45,
pp. 1297-1321. (SCI)
-
D. M. Tsai, P. C. Lin
and C. J. Lu, 2006, “An independent component
analysis-based filter design for defect detection in
low-contrast surface images ,” Pattern Recognition, vol.
39, pp. 1679-1694. (SCI)
-
S. M. Chao and D. M.
Tsai, 2006,
“Astronomical image restoration using an improved
anisotropic diffusion,” Pattern Recognition Letters,
vol. 27, pp. 335-344. (SCI)
-
H.
N.
Yen,
D. M. Tsai
and J.
Y.
Yang,
2006,
“Full-field 3D measurement of solder pastes using
LCD-based phase shifting techniques,” IEEE Transactions
on Electronics Packaging Manufacturing, vol. 29, pp.
50-57. (SCI)
-
Y. H. Tseng and D. M.
Tsai , 2006, “Using independent component analysis based
process monitoring in TFT-LCD manufacturing,” Journal of
the Chinese Institute of Industrial Engineers, vol. 23,
pp. 262-267. (EI)
-
D. M. Tsai and R. H.
Yang, 2005, “An eigenvalue-based similarity measure and
its application in defect detection, ” Image and Vision
Computing, vol. 23, pp. 1094-1101. (SCI)
-
D. M. Tsai and C. H.
Yang, 2005, “A quantile-quantile plot based pattern
matching for defect detection,” Pattern Recognition
Letters, vol. 26, pp. 1948-1962. (SCI)
-
D. M. Tsai and C. Y.
Hung, 2005, “Automatic defect
inspection of patterned TFT-LCD panels using 1-D Fourier
reconstruction and wavelet decomposition,”
International Journal of Production Research, vol. 43,
pp. 4589-4607. (SCI)
-
D. M. Tsai, C. P. Lin
and K. T. Huang, 2005, “Defect
detection in colored texture surfaces using Gabor
filters,” The Imaging Science
Journal, vol. 53, pp.
27-37. (SCI)
-
D. M. Tsai and S. M.
Chao, 2005, “An anisotropic
diffusion-based defect detection for sputtered surfaces
with inhomogeneous textures,”
Image and Vision Computing,
vol. 23, pp. 325-338.
(SCI)
-
C.
J. Lu and D. M. Tsai, 2005, “Automatic defect inspection
for LCDs using singular value decomposition,”
International Journal of Advanced Manufacturing
Technology, vol. 25, pp.
53-61. (SCI)
-
E. Zahara, S. K. S.
Fan. and D. M. Tsai, 2005,
“Optimal multi-thresholding
using a hybrid optimization approach,”
Pattern Recognition Letters, vol.26,
pp. 1082-1095. (SCI)
-
C. J. Lu and D. M. Tsai, 2004, “Defect
inspection of patterned TFT-LCD panels using a fast
sub-image based SVD,”
International Journal of Production Research,
vol. 42, pp. 4331-4351. (SCI)
-
H.
N. Yen and D. M. Tsai, 2004, “A fast full-field 3D
measurement system for BGA coplanarity inspection,”
International Journal of Advanced Manufacturing
Technology, vol. 24, pp. 132-139. (SCI)
-
D.
M. Tsai, C. T. Lin and J. F. Chen, 2003, “The evaluation
of normalized cross correlations for defect detection,”
Pattern Recognition Letters, vol. 24, pp. 2525-2535.
(SCI)
-
D.
M. Tsai and C. T. Lin, 2003, “Fast normalized cross
correlation for defect detection,” Pattern Recognition
Letters, vol. 24, pp. 2625-2631. (SCI)
-
D. M. Tsai and
T. Y. Huang, 2003, “Automated surface inspection for
statistical textures,” Image and Vision Computing, vol.
21, pp. 307-323. (SCI)
-
D. M. Tsai and
C .H. Chiang, 2003, “Automatic band selection for
wavelet reconstruction in the application of defect
detection,” Image and Vision Computing, vol. 21, pp.
413-431. (SCI)
-
D.M. Tsai, T.Y. Huang, 2003, “Automated surface
inspection for statistical textures,” Image and Vision
Computing, vol. 21, pp.307-323
-
D. M. Tsai and C. C. Chou, 2003, “A fast focus measure
for video display inspection,” Machine Vision &
Applications, vol. 14, pp.192-196.
-
K. H. Hsiehn
and D. M. Tsai, 2003, “A non-referential machine vision
approach for BGA substrate inspection,” Journal of the
Chinese Institute of Industrial Engineers, vol. 20, pp.
125-138.
-
D. M.
Tsai and Y. H. Tsai, 2003, “Defect detection in textured
surfaces using color ring-projection correlation,”
Machine Vision and Applications, vol. 13, pp. 194-200.
-
D. M. Tsai and B. T. Lin, 2002, “Defect detection of
gold-plated surfaces on PCBs using entropy measures,”
International Journal of Advanced Manufacturing
Technology, vol. 20, pp. 420-428.
-
D.M. Tsai, Y.H. Tsai, 2002,
“Rotation-invariant pattern matching with color
ring-projection,” Pattern Recognition, vol. 35,
pp.131-141
-
D.M. Tsai, C.H. Chiang, 2002,
“Rotation-invariant pattern matching using wavelet
decomposition,” Pattern Recognition Letters, vol. 23,
pp.191-201
-
D.
M. Tsai and C. P. Lin, 2002,
“Fast defect detection in
textured surfaces unsing 1D Gabor filters,”
International Journal of
Advanced Manufacturing Technology, vol. 20, pp. 664-675.
-
D. M.
Tsai and C. H. Chiang, 2002, “Rotation-invariant pattern
matching using wavelet decomposition,” Pattern
Recognition Letters, vol. 23, pp. 191-201. (SCI)
-
D. M. Tsai and Y.
H. Tsai, 2002, “Rotation-invariant pattern matching with
color ring-projection,” Pattern Recognition, vol. 35,
pp. 131-141.
-
C.H. Yeh, D.M. Tsai, 2001,
“Wavelet-based approach for ball grid array (BGA)
substrate conduct paths inspection,” International
Journal of Production Research, vol. 39, pp.4281-4299
-
C.
H. Yeh and D. M. Tsai, 2001, “Wavelet-based approach for
ball grid array (BGA) substrate conduct paths
inspection,” International Journal of Production
Research, vol. 39, pp. 4281-4299. (SCI)
-
D. M. Tsai and B. Hsiao, 2001, “Automatic surface
inspection using wavelet reconstruction,” Pattern
Recognition, vol. 34, pp. 1285-1305. (SCI)
-
D.
M. Tsai, S. K. Wu and M. C. Chen, 2001, “Optimal Gabor
filter design for texture segmentation using stochastic
optimization,” Image and Vision Computing, vol. 19, pp.
299-316. (SCI)
-
C. H. Yeh and D. M. Tsai, 2001, “A
rotation-invariant and nonreferential approach for ball
grid array (BGA) substrate conduct paths inspection,”
International Journal of Advanced Manufacturing
Technology, vol. 17, pp. 412-424. (SCI)
-
C.H. Yeh, D.M. Tsai, 2001, “A
rotation-invariant and non-referential approach for ball
grid array (BGA) substrate conducting path inspection,”
International Journal of Advanced Manufacturing
Technology, vol. 17, pp.412-424
-
D. M. Tsai and S.
K. Wu, 2000, “Automated surface inspection using Gabor
filters,” International Journal of Advanced
Manufacturing Technology , vol. 16, pp. 474-482. (SCI)
-
D.
M. Tsai and C. Y. Hsieh, 1999, “Automated surface
inspection for directional textures,” Image and Vision
Computing, vol. 18, pp. 49-62. (SCI)
-
S.
M. Guu and D. M. Tsai, 1999, “Measurement of roundness:
a nonlinear approach,” Proc. Natl. Sci. Counc. ROC(A),
vol. 23, pp. 348-352.
-
P.
K. Wang and D. M. Tsai, 1999, “Machine vision for
leadframe process quality monitoring,” Journal of the
Chinese Institute of Industrial Engineers, vol.16, pp.
533-549; NSC88-2212-E-155-010. (in Chinese)
-
D. M. Tsai and C. F. Tseng, 1999,
“Surface roughness classification for castings,” Pattern
Recognition, vol. 32, pp. 389-405; NSC88-2213-E-155-013.
(SCI)
-
D. M. Tsai, 1999,
“A machine vision approach for detecting and inspecting
circular parts,” International Journal of Advanced
Manufacturing Technology, vol. 15, pp. 217-221. (SCI)
-
D. M.
Tsai, H.-T. Hou and H.-J. Su, 1999, “Boundary-based
corner detection using eigenvalues of covariance
matrices,” Pattern Recognition Letters, vol. 20, pp.
31-40. (SCI)
-
M.
C. Chen, D. M. Tsai and H. Y. Tseng, 1999, “A stochastic
optimization approach for roundness measurements,”
Pattern Recognition Letters, vol. 20, pp. 707-719. (SCI)
-
Chen, M.-C., D. M. Tsai, Tseng,
H.-Y., 1999, “A stochastic optimization approach for
roundness measurements,” Pattern Recognition Letters,
vol. 20, pp.707-719. (SCI)
-
Guu, Sy-Ming, D. M. Tsai,
1999, “Measurement of roundness: A nonlinear approach,”
Proceedings of the National Science Council, Republic of
China, Part A: Physical Science and Engineering, vol.
23, pp.348-352. (SCI)
-
D. M. Tsai, 1999, “Machine
vision approach for detecting and inspecting circular
parts,” International Journal of Advanced Manufacturing
Technology, vol. 15, pp.217-221. (SCI)
-
D. M.
Tsai and H. J. Wang, 1998, “Segmenting focused objects
in complex visual images,” Pattern Recognition Letters,
vol. 19, pp. 929-940. (SCI)
-
D. M. Tsai, J. J.
Chen and J. F. Chen, 1998, “A vision system for surface
roughness assessment using neural networks,”
International Journal of Advanced Manufacturing
Technology, vol. 14, pp. 412-422; NSC87-2213-E-155-021.
(SCI)
-
D. M. Tsai, Wang, H.-J., 1998,
“Segmenting focused objects in complex visual images,”
Pattern Recognition Letters, vol. 19, pp.929-940. (SCI)
-
D. M. Tsai, C. Y.
Chien and P. K. Wang, 1998, “Model based 3D parts
recognition from a single image,” Journal of the Chinese
Institute of Industrial Engineers, vol. 15, pp. 523-532;
NSC85-2212-E-155-010.(in Chinese)
-
D. M. Tsai and C.
T. Lin, 1998, “A moment-preserving approach for depth
from defocus,” Pattern Recognition, vol. 31, pp.
551-560; NSC87-2212-E-155-006. (SCI)
-
D. M. Tsai, 1997,
“An improved generalized Hough transform for the
recognition of overlapping objects,” Image and Vision
Computing, vol. 15, pp. 887-888; NSC84-2213-E-155-002.
(SCI)
-
D.
M. Tsai, and J. I. Tzeng, 1997, “Dimensional and angular
measurements using least squares and neural networks,”
International Journal of Advanced Manufacturing
Technology, vol. 13, pp. 55-66; NSC86-2213-E-155-003.
(SCI)
-
D. M. Tsai, 1997, “An improved
generalized Hough transform for the recognition of
overlapping objects,” Image and Vision Computing, vol.
15, pp.877-888. (SCI)
-
D. M. Tsai, 1997, “Boundary-based corner detection using
neural networks,” Pattern Recognition, vol. 30, pp.
85-97. (SCI)
-
D. M. Tsai, Lu, W.-J., 1996, ”
Detecting and locating burrs of industrial parts,”
International Journal of Production Research, vol. 34,
pp. 3187-3205. (SCI)
-
D. M. Tsai, 1996, “Locating overlapping industrial parts
for robotic assembly,” International Journal of Advanced
Manufacturing Technology, vol. 12, pp. 288-302;
NSC83-0415-E-155-033. (SCI)
-
M. C. Chen and D.
M. Tsai, 1996, “Simulation optimization through direct
search for multi-objective manufacturing systems,”
Production Planning and Control, vol. 7, pp. 554-565.
(SCI)
-
Chen, M.-C., D. M. Tsai, 1996, “A
simulated annealing approach for optimization of
multi-pass turning operations,” International Journal of
Production Research, vol. 34, pp.2803-2825. (SCI)
-
D. M. Tsai and R.
Y. Tsai, 1996, “Use neural networks to determine
matching order for recognizing overlapping objects,”
Pattern Recognition Letters, vol. 17, pp. 1077-1088.
(SCI)
-
D. M. Tsai, 1996,” Locating
overlapping industrial parts for robotic assembly,”
International Journal of Advanced Manufacturing
Technology, vol. 12, pp.288-302.(SCI)
-
M. C. Chen and D.
M. Tsai, 1996, “A simulated annealing approach for
optimization of multi-pass turning operations,”
International Journal of Production Research, vol. 34,
pp. 2803-2825. (SCI)
-
D. M. Tsai and M.
F. Chen, 1996, “A fast machine vision approach for
automatic recognition of industrial parts,”
International Journal of Production Research, vol. 34,
pp. 687-699. (SCI)
-
D. M. Tsai, 1996,
“Detecting and locating partially occluded planar parts
by clustering,” IIE Transactions, vol. 28, pp. 531-544;
NSC82-0415-E-155-020. (SCI)
-
D. M. Tsai and W.
J. Lu, 1996, “Detecting and locating burrs of industrial
parts,” International Journal of Production Research,
vol. 34, pp. 3187-3205; NSC82-0415-E-155-068. (SCI)
-
M. F. Chen and D.
M. Tsai, 1996, “Economic design of turning operations,”
Journal of the Chinese Institute of Industrial
Engineers, vol. 13, pp. 349-361. (in Chinese)
-
D. M. Tsai, 1995,
“A three-dimensional machine vision approach for
automatic robot programming,” Journal of Intelligent and
Robotic Systems, vol. 12, pp. 23-48; NSC80-0415-E-155-02
and NSC81-0415-E-155-07. (SCI)
-
D. M. Tsai, 1995,
“A fast thresholding selection procedure for multimodal
and unimodal histograms,” Pattern Recognition Letters,
vol. 16, pp. 653-666. (SCI)
-
D. M. Tsai and M.
F. Chen, 1995, “Object recognition by a linear weight
classifier,” Pattern Recognition Letters, vol. 16, pp.
591-600. (SCI)
-
D. M. Tsai and M.
F. Chen, 1994, “Curve fitting approach for tangent angle
and
curvature
measurements,” Pattern Recognition, vol. 27, pp.
699-711.
-
D.
M. Tsai, E. M. Malstrom and W. Kuo,1994, “Physical
simulation of a three dimensional palletizing
heuristic,” International Journal of Production
Research, vol. 32, pp. 1159-1171. (SCI)
-
D. M. Tsai and M.
J. Yao, 1993, “A line-balance-based capacity planning
procedure for series-type robotic assembly line,”
International Journal of Production Research, vol. 31,
pp. 1901-1920. (SCI)
-
D.
M. Tsai, E. M. Malstrom and W. Kuo, 1993, “Three
dimensional palletization of mixed box sizes,” IIE
Transactions, vol. 25, pp. 64-75.
-
D. M. Tsai, Yao, Ming-Jong, 1993,
“Line-balance-based capacity planning procedure for
series-type robotic assembly line,” International
Journal of Production Research, vol. 31, pp.1901-1920.
(SCI)
-
D. M. Tsai and Y.
H. Chen, 1992, “A fast histogram-clustering approach for
multi-level thresholding,” Pattern Recognition Letters,
vol. 13, pp. 245-252. (SCI)
-
D. M. Tsai and E.
M. Malstrom and H. D. Meeks, 1988, “A two-dimensional
palletizing procedure for warehouse loading operations,”
IIE Transactions, vol. 20, pp. 418-425.
-
R. H. Choi, E. M.
Malstrom and D. M. Tsai, 1988, “Evaluating lot-sizing
methods in multilevel inventory system by simulation,”
Production and Inventory Management Journal, vol. 29,
pp. 4-10.
-
D. M. Tsai, H.-Y Tsai, W.-Y. Chiu, 2019,"Mura defect
inspection in Liquid Crystal Display panels using optical
flow-based motion analysis, "The 20th Asia Pacific
Industrial Engineering and Management Science Conference.
-
D. M. Tsai, Shu-Kai Fan, Yi-Quan Huang, 2019,"Saw-mark
defect detection in heterogeneous solar wafer images using
GAN-based Training Samples Generation and CNN
Classification , " VISAPP.
-
D. M. Tsai, Yan-Hsin Tseng, 2018,"Defect inspection of
liquid-crystal-display (LCD) panels in repetitive
pattern images using 2D Fourier image reconstruction,
"The Fourteenth International Conference on Autonomic
and Autonomous Systems, France.
-
D. M.
Tsai, Shu-Kai S. Fan, Chih-Hung Jen, Rui-Yu Huang and Kuan-Lung
Chen , 2016,"Key parameter identification for faulty wafer
detection using image processing, "ICAS .
-
D. M. Tsai, Wan-Ling Chen, 2018,"Segmentation of coffee
plantation area in satellite image using Fourier feature,
"The 19th Asia-Pacific Industrial Engineering and
Management Systems Conference, HK,
-
Du-Ming Tsai, Wei-Yao Chiu, 2017, "Automated visual
inspection of multicrystalline solar wafer using wavelet
discrimination measure, "The 18th Asia Pacific Industrial
Engineering and Management Systems Conference, Indonesia.
-
Du-Ming Tsai, I-Yung Chiang and Wei-Yao
Chiu, 2016,"Optical-flow-based
template matching for surface defect detection,
"International Congress on
Engineering and Information, Japan.
-
Du-Ming Tsai, Tzu-Hsun Tseng and Wei-Yao
Chiu, 2015, "Surface defect
detection in low-contrast images using basis image
representation, "IAPR
International Conference on Machine Vision Applications,
Japan.
-
Du-Ming Tsai, Wei-Yao Chiu and Tzu-Hsun
Tseng, 2015, "Moving object
detection from a mobile robot using basis image matching,
"IS&T/SPIE
Electronic Imaging, USA.
-
Du-Ming Tsai, Yi-Jun
Xie,2015,"Automatic Crack Detection in Textured Metal
Surfaces Using Machine Vision, "The 16th Asia Pacific
Industrial Engineering
and Management Science Conference, Vietnam.
-
Du-Ming Tsai, Yan-Hsin Tseng and Wei-Yao
Chiu, 2014,"Automatic defect inspection of TFT-LCD panels
using Fourier image reconstruction, "The 15th Asia Pacific
Industrial Engineering and Management Science
Conference(APIEMS 2014), Jeju, Korea.
-
Du-Ming Tsai,Wei-Yao Chiu and Jie-Yu
Luo,2014,” Automatic visual inspection of solar wafers using
mean-shift techniques,” The Annual Conference on Engineering
and Information Technology (ACEAIT 2014), Tokyo , Japan.
-
Du-Ming Tsai, Shih-Chieh Wu and Wei-Yao Chiu, 2013,
"Automatic visual inspection of solar modules using
Independent component analysis,"The 14th Asia Pacific
Industrial Engineering and Management Science
Conference(APIEMS 2013),Cebu,Philippines.
-
Du-Ming Tsai, Wei-Yao Chiu, 2013,"A real-time ICA-based
activity recognition in video sequences,"MVA2013(IAPR
International Conference on Machine Vision Applications),Kyoto,Japan.
-
Du-Ming Tsai, Wei-Yao Chiu, 2013,"Dual-mode Detection for
Foreground Segmentation in Low-Contrast Video Images,"
VISIGRAPP2013(8th Int’l. Joint Conf. on Computer Vision,
Imaging and Computer Graphics Theory and Applications), Barcelona,Spain.
-
Du-Ming
Tsai, I-Yung Chiang, Hao Hsu and Wei-Yao Chiu, 2012, "A Shift-tolerant Dissimilarity Measure for
Surface Defect Detection," The 13th Asia Pacific Industrial
Engineering and Management Systems Conference, Phuket,
THAILAND.
-
Du-Ming Tsai, Wei-Yao
Chiu, and Ming-Chun Chen, 2012, “A PCA-based regularity
measure for surface defect inspection,” The Institute of
Industrial Engineers Asian Conference, Singapore.
-
Wei-Yao Chiu and Du-Ming Tsai,
2012, “ICA-based Action Recognition for
Human-computer Interaction in Disturbed Backgrounds,”7th
International Joint Conference on Computer Vision, Imaging
and Computer Graphics Theory and Applications (VISIGRAPP
2012), Rome, Italy.
-
Wei-Chen Li and Du-Ming Tsai, 2011, “Automatic Saw-Mark
Detection in Multicrystalline Solar Wafer Images,” The
12th Asia Pacific Industrial Engineering and Management
Science Conference (APIEMS 2011), Beijing, China.
-
S.M. Chao, D.M. Tsai, 2010,
“Anisotropic diffusion-based detail-preserving smoothing for
image restoration,” Proceedings - International Conference
on Image Processing, ICIP, pp.4145-4148
-
Wei-Yao Chiu
and Du-Ming Tsai, 2010, “A macro-observation approach of intelligence video
surveillance for real-time unusual event detection,” The 2010
International Symposium on Service, Security and its Data management
technologies in Ubi-com (SSDU), Xi’an, China.
-
Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li and Wei-Yao Chiu,
2010, “A generalized anisotropic diffusion for defect
detection in low-contrast surfaces,” 20th International
Conference on Pattern Recognition(ICPR), Istanbul, Turkey.
-
Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu and Wei-Chen
Li, 2010, “Anisotropic diffusion-based detail-preserving
smoothing for image restoration,” 2010 International
Conference on Image Processing(ICIP), The Hong Kong
Convention and Exhibition Centre, Hong Kong.
-
Wei-Chen Li and Du-Ming Tsai, 2009,
“Defect inspection in
low-contrast LCD images using Hough transform-based
non-stationary line detection,” The 10th Asia Pacific
Industrial Engineering and Management Science Conference (APIEMS
2009), Kokura, Japan.
-
Du-Ming
Tsai and Wei-Yao Chiu, 2009, “A Micro-observation Approach
for Real-time Unusual Event Detection in Video,” The 12th
IEEE International Conference on Computer Vision (ICCV), Kyoto,
Japan.
-
Du-Ming Tsai, 2009, “Visual defect detection in low-contrast
surfaces using anisotropic diffusion,” Siberian-Taiwan-Forum
Proceedings, Tomsk, Russia.
-
Du-Ming Tsai, Yan-Jheng Su, and Wei-Yao Chiu,
2008 “Non-referential, self-compared shape defect inspection
for PCB bond pads,” The 9th Asia Pacific Industrial
Engineering and Management Science Conference (APIEMS 2008),
Bali, Indonesia.
-
蔡篤銘、蔡欣洋, 2008,“應用動態影像處理之光流法於液晶顯示器面板之Mura瑕疵檢測,”中國工業工程學會九十七年度年會暨學術研討會,中原大學,中壢市。
-
Wei-Chen Li, Du-Ming Tsai, Wei-Yao Chiu, and Ya-Hui Tsai,
2007, “Motion detection with a moving camera for mobile
robot surveillance,” Proceedings of the 8th Asia Pacific
Industrial Engineering & Management System and 2007 Chinese
Institute of Industrial Engineers Conference (APIEMS & CIIE
Conference 2007), Kaohsiung, Taiwan.
-
Du-Ming Tsai,
Su-Ta Chuang, Yan-Hsin Tseng, 2006, “Automatic defect
inspection of patterned TFT-LCD panels using Fourier image
reconstruction,” The International Conference on Industrial
Engineering Theory, Application and Practice(IJIE), Nagoya,
Japan.
-
Shin-Min
Chao, Du-Ming Tsai, Yan-Hsin Tseng and Yuan-Ruei Jhang,2006,
“ Defect detection in low-contrast glass substrates using
anisotropic diffusion,” The 18th International Conference
on Pattern Recognition (ICPR), Hong Kong.
-
Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao and
Chao-Hsuan Yen ,2006, “ Independent component analysis based
filter design for defect detection in low-contrast textured
images,” The 18th International Conference on Pattern
Recognition (ICPR), Hong Kong.
-
Shin-Min Chao, Du-Ming Tsai and Ya-Hui
Tsai, 2006, “Independent component analysis based motion
detection for indoor surveillance,” The 36th
International Conference on Computers and Industrial
Engineering (CIE), Taipei, Taiwan.
-
Chi-Jie Lu, Du-Ming Tsai, Chih-Chou Chiu
and Yan-Hsin Tseng, 2006, “Independent component analysis
based disturbance separation for statistical process
control,” The 36th International Conference on Computers
and Industrial Engineering (CIE), Taichung, Taiwan.
-
曾彥馨、蔡篤銘,
2005,“Using
independent component analysis based process monitoring in
TFT-LCD manufacturing,”中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。
-
趙新民、蔡篤銘, 2005,“An
anisotropic diffusion-based defect detection for
low-contrast LCD glass substrates,”中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。
-
蔡篤銘、呂奇傑、林品杰,
2005,“應用獨立成份分析(ICA)濾波器於TFT-LCD面板之瑕疵檢測,”
中國工業工程學會九十四年度年會暨學術研討會,中華大學,新竹市。
-
Shin-Min Chao and Du-Ming Tsai,
2005, “An anisotropic diffusion-based defect detection for
backlight panels,” 6th Asia Pacific Industrial
Engineering and Management Science Conference, Manila,
Philippines.
-
Du-Ming Tsai, Chi-Jie Lu, Ping-Chieh Lin and Yan-Hsin Tseng,
2005, “Defect detection of backlight panel surfaces using
independent component analysis filering scheme,” 6th Asia
Pacific Industrial Engineering and Management Science
Conference, Manila, Philippines.
-
趙新民、蔡篤銘, 2005,“Astronomical
image restoration using anisotropic diffusion,”第四屆資訊與管理應用研討會,元培技術學院,新竹市。
-
Yan-Hsin Tseng
and Du-Ming Tsai, 2005, “Using Independent Component
Analysis for Process Monitoring in TFT-LCD Manufacturing,” The 3rd ANQ Congress &
The 19th Asia Quality Symposium, Taipei, Taiwan,
September 20-23.
-
蔡篤銘、林品杰、曾彥馨,
2005,“應用獨立成份分析濾波器於背光板與TFT-LCD面板之瑕疵檢測,”
第五屆全國AOI論壇與展覽,交通大學,新竹市。
-
Chi-Jie Lu and Du-Ming Tsai, 2004, “Defect Detection of
Patterned TFT-LCD Surfaces Using Independent Component
Analysis,”
中國工業工程學會九十三年度年會暨學術研討會,成功大學,台南市。
-
Chi-Jie Lu and Du-Ming Tsai, 2004, “Defect Inspection of
Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD,”
The Fifth Asia-pacific conference on Industrial
Engineering and Management Systems, Gold Coast,
Australia, December 12-15.
-
曾彥馨、蔡篤銘,
2004, “應用機器視覺於TFT面板之表面瑕疵檢測與分類,”
第四屆全國AOI論壇與展覽,交通大學,新竹市。
-
江行全、蔡篤銘、呂奇傑、朱建政、楊程翔,2004“應用機器視覺技術於臂章圖形之自動邊界偵測,”
第四屆全國AOI論壇與展覽,交通大學,新竹市。
-
趙新民、蔡篤銘,
2003, “應用非線性擴散於非同質性紋路之濺鍍玻璃基板表面檢測,”
中國工業工程學會九十二年度年會暨學術研討會,建國科技大學,彰化市。
-
Chi-Jie Lu, Du-Ming Tsai and Hsu-Nan Yen, 2002,
“Automatic Defect Inspection for LCDs Using Singular
Value Decomposition,”
The Fourth Asia-pacific conference
on Industrial Engineering and Management Systems,
Taipei, Taiwan, December 18-22.
-
Hsu-Nan Yen and Du-Ming Tsai, 2002,
“An adaptive
machine vision system for electronic components
inspection,” Proceedings of IE&EM’2002 & IceCE’2002
and
Enterprise Management
(IE&EM’2002), RID215, 1-8, Beijing, China.
-
蔡篤銘、顏旭男及謝坤翰,
2001, “應用準確白光相移技術於BGA共平面之檢測,”
中國工業工程學會學術研討會,義守大學,高雄縣。
-
蔡篤銘、顏旭男及謝坤翰,2001,
“應用白光相位移技術於BGA高度之檢測,”
2001年PCB製造技術研討會,
元智大學,中壢市。
-
Du-Ming Tsai and Chi-Hao Yeh,2000,
“Ball Grid Array (BGA)
substrate inspection by 1-D wavelet-transform,” The
5th Annual International Conference on Industrial
Engineering – Theory, Applications and Practice.
-
Du-Ming Tsai and B. Hsiao, “Defect detection using
wavelet reconstruction,” The 13th IPPR Conference on
Computer Vision, Graphics and Image Processing,
2000.
-
Du-Ming Tsai and S. K. Wu,1999,
“Automated surface inspection
using Gabor filters,” 12th IPPR Conference on
Computer Vision, Graphics and Image Processing,.
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