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PZ¬ì§Þ¹q¤lªÑ¥÷¦³¤½¥q (2007 October~present)
°ê»Ú´Á¥Z½×¤å (International Journal Papers)
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Wei-Chen Li and Du-Ming Tsai, 2011, ¡§Wavelet-based
defect detection in solar wafer images with inhomogeneous texture,¡¨ Pattern Recognition. ( to appear) (SCI)
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Wei-Chen Li and Du-Ming Tsai, 2011, ¡§Automatic saw-mark
detection in multicrystalline solar wafer images,¡¨ Solar Energy Materials and Solar cells, Vol. 95, pp. 2206-2220. (SCI)
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Wei-Chen Li and Du-Ming Tsai, 2011, ¡§Defect inspection
in low-contrast LCD images using Hough transform-based nonstationary
line detection,¡¨
IEEE Transactions on Industrial Informatics, Vol.
7, pp. 136-147. (SCI)
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Y. H. Tsai, D. M. Tsai, Wei-Chen
Li, W. Y. Chiu and M. C. Lin, 2011, ¡§Surface defect detection of 3D objects
using robot vision,¡¨ Industrial Robot, Vol. 38, pp. 381-398.
(SCI)
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Yih-Chih Chiou
and Wei-Chen Li, 2009, ¡§Flaw detection of
cylindrical surfaces in PU-packing by using machine vision technique,¡¨Measurement, Vol. 42, pp. 989-1000.
¬ã°Q·|½×¤å (International Conference Papers)
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Shin-Min Chao, Du-Ming Tsai, Wei-Chen
Li and Wei-Yao Chiu, 2010, ¡§A generalized anisotropic diffusion for
defect detection in low-contrast surfaces,¡¨ 20th
International Conference on Pattern Recognition (ICPR), Istanbul, Turkey.
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Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu and Wei-Chen Li, 2010, ¡§Anisotropic diffusion-based
detail-preserving smoothing for image restoration,¡¨
2010 International Conference on Image Processing (ICIP), The Hong Kong
Convention and Exhibition Centre, Hong Kong.
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Wei-Chen Li and Du-Ming Tsai, 2009, ¡§Defect inspection
in low-contrast LCD images using Hough transform-based non-stationary line
detection,¡¨ The 10th Asia Pacific Industrial
Engineering and Management Science Conference (APIEMS 2009),
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Wei-Chen Li, Du-Ming Tsai, Wei-Yao Chiu, and Ya-Hui Tsai, ¡§Motion detection with a moving camera for
mobile robot surveillance,¡¨APIEMS&CIIE Conference
2007,
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ªô«³契¡B李³辰¡A¡§À³¥Î¾÷¾¹µøı©óPU-±K«Ê¤¸¥ó(Packing)¤§·å²«ÀË´ú¡¨¡A²Ä¤Q¥|©¡¥þ°ê¦Û°Ê¤Æ¬ì§Þ¬ã°Q·|(CIAE)¡A«Ø°ê¬ì§Þ¤j¾Ç¡A¹ü¤Æ¡A2006¦~6¤ë¡C
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¡P ½²¿w»Ê¡B§õ³¨°¡Bªô«Â³ó¡B´¿¤l¾±¡B§õ©s¿«¡A¡u³Ì¨Î¤Æ¼v¹³³B²zºtºâªk¡v¡A °]¹Îªk¤H¤u·~§Þ³N¬ã¨s°| ¾÷±ñ»P¨t²Î©Ò (2011/03~2011/11)¡C
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¡P ½²¿w»Ê¡B»¯·s¥Á¡B´¿«ÛÄÉ¡B§õ«\â¡B§õ³¨°¡A¡u«O¥þ¾÷¾¹¤H±j°·©ÊµøıºÊ´ú§Þ³N¡v¡A °]¹Îªk¤H¤u·~§Þ³N¬ã¨s°| ¾÷±ñ»P¨t²Î©Ò (2007/04~2007/11)¡C
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Yih-Chih Chiou
and Wei-Chen Li,¡§Apply Machine
Vision to the Inspection of PU-Packing,¡¨ Institute of
Mechanical and Aerospace Engineering,